Результаты исследований: Научные публикации в периодических изданиях › статья по материалам конференции › Рецензирование
Application of metasurface-based low-pass filters for improving THz-TDS characteristics. / Nikolaev, N. A.; Rybak, A. A.; Kuznetsov, S. A.
в: Journal of Physics: Conference Series, Том 1461, № 1, 012118, 23.04.2020.Результаты исследований: Научные публикации в периодических изданиях › статья по материалам конференции › Рецензирование
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TY - JOUR
T1 - Application of metasurface-based low-pass filters for improving THz-TDS characteristics
AU - Nikolaev, N. A.
AU - Rybak, A. A.
AU - Kuznetsov, S. A.
PY - 2020/4/23
Y1 - 2020/4/23
N2 - We propose an approach to improve the technical characteristics of terahertz time-domain spectrometers at low-frequency measurements. The approach is based on applying low-pass THz filters to narrow the frequency band of the THz signal that allows increasing the sampling interval in accordance with the Nyquist-Shannon theorem. This concept was verified by studying the transmission spectra of low-frequency band-pass THz filters centered at 156 and 376 GHz. We confirm that the high-quality low-pass filters can improve accuracy of THz measurements and significantly reduce data acquisition time. The reduction up to 12 times was experimentally demonstrated in our case.
AB - We propose an approach to improve the technical characteristics of terahertz time-domain spectrometers at low-frequency measurements. The approach is based on applying low-pass THz filters to narrow the frequency band of the THz signal that allows increasing the sampling interval in accordance with the Nyquist-Shannon theorem. This concept was verified by studying the transmission spectra of low-frequency band-pass THz filters centered at 156 and 376 GHz. We confirm that the high-quality low-pass filters can improve accuracy of THz measurements and significantly reduce data acquisition time. The reduction up to 12 times was experimentally demonstrated in our case.
UR - http://www.scopus.com/inward/record.url?scp=85084149674&partnerID=8YFLogxK
U2 - 10.1088/1742-6596/1461/1/012118
DO - 10.1088/1742-6596/1461/1/012118
M3 - Conference article
AN - SCOPUS:85084149674
VL - 1461
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
SN - 1742-6588
IS - 1
M1 - 012118
T2 - 4th International Conference on Metamaterials and Nanophotonics, METANANO 2019
Y2 - 15 July 2019 through 19 July 2019
ER -
ID: 24224408