TY - JOUR

T1 - Application of Capacitive Microstructures as Anti-Aliasing Filters for Terahertz Time-Domain Spectroscopy

AU - Rybak, A. A.

AU - Nikolaev, N. A.

AU - Kuznetsov, S. A.

AU - Yang, Sh H.

N1 - Funding Information: This work was funded by the Ministry of Science and Higher Education of the Russian Federation (State Registration AAAA-A17-117052410033-9) and the Russian Foundation for Basic Research (Project No. 18-29-20066)

PY - 2020/1/1

Y1 - 2020/1/1

N2 - This paper first considers an approach based on the application of high-performance capacitive microstructures as anti-aliasing filters for low-frequency (sub-terahertz) measurements in terahertz time-domain spectroscopy. The approach was tested in measurements of the spectra of reference samples — bandpass filters with central frequencies of 156 and 376 GHz and a bandwidth of ∼12%. It is shown that the spectrometer measurement time is decreased by a factor of up to 12 with an improvement in measurement accuracy due to the elimination of the long-term drift of the normalization signal. This approach is supposed to be used to increase the dynamic range and the spectrometer signal-to-noise ratio in the sub-terahertz region.

AB - This paper first considers an approach based on the application of high-performance capacitive microstructures as anti-aliasing filters for low-frequency (sub-terahertz) measurements in terahertz time-domain spectroscopy. The approach was tested in measurements of the spectra of reference samples — bandpass filters with central frequencies of 156 and 376 GHz and a bandwidth of ∼12%. It is shown that the spectrometer measurement time is decreased by a factor of up to 12 with an improvement in measurement accuracy due to the elimination of the long-term drift of the normalization signal. This approach is supposed to be used to increase the dynamic range and the spectrometer signal-to-noise ratio in the sub-terahertz region.

KW - bandpass filters

KW - frequency-selective surfaces

KW - low-pass filters

KW - metamaterials

KW - microstructures

KW - sampling theorem

KW - terahertz time-domain spectroscopy

KW - SPECTROMETER

KW - SUBTERAHERTZ

KW - METALLIC MESH

KW - GENERATION

KW - MESH INTERFERENCE FILTERS

UR - http://www.scopus.com/inward/record.url?scp=85089025454&partnerID=8YFLogxK

U2 - 10.3103/S8756699020010136

DO - 10.3103/S8756699020010136

M3 - Article

AN - SCOPUS:85089025454

VL - 56

SP - 101

EP - 108

JO - Optoelectronics, Instrumentation and Data Processing

JF - Optoelectronics, Instrumentation and Data Processing

SN - 8756-6990

IS - 1

ER -