Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная › Рецензирование
Angle-Susceptible Narrowband Terahertz Metasurface for Thin-Film Sensing. / Nikolaev, Nazar; Kuznetsov, Sergei; Beruete, Miguel.
2018 48th European Microwave Conference, EuMC 2018. Institute of Electrical and Electronics Engineers Inc., 2018. стр. 420-423 8541443 (2018 48th European Microwave Conference, EuMC 2018).Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная › Рецензирование
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TY - GEN
T1 - Angle-Susceptible Narrowband Terahertz Metasurface for Thin-Film Sensing
AU - Nikolaev, Nazar
AU - Kuznetsov, Sergei
AU - Beruete, Miguel
N1 - Funding Information: ACKNOWLEDGMENT The work is partially supported by the Russian Foundation for Basic Research (Project #17-32-80039). The authors gratefully acknowledge the Shared Equipment Center “Spectroscopy and Optics” of the Institute of Automation and Electrometry, SB RAS for the provided instrumental support of THz measurements. Publisher Copyright: © 2018 European Microwave Association.
PY - 2018/11/20
Y1 - 2018/11/20
N2 - The plasmonic metasurface with the angle-sensitive resonance positioned in the vicinity of 0.8-0.9 THz was proposed for THz thin-film sensing and its performance under oblique illumination was numerically investigated and experimentally tested. It is shown that the metasurface can be effectively used to substitute spectral measurements for the single-wavelength ones by tracking the transmission at different angles of incidence. The proposed approach is evaluated as promising for sensing sub micron-thick analyte layers.
AB - The plasmonic metasurface with the angle-sensitive resonance positioned in the vicinity of 0.8-0.9 THz was proposed for THz thin-film sensing and its performance under oblique illumination was numerically investigated and experimentally tested. It is shown that the metasurface can be effectively used to substitute spectral measurements for the single-wavelength ones by tracking the transmission at different angles of incidence. The proposed approach is evaluated as promising for sensing sub micron-thick analyte layers.
KW - sub millimeter wave devices
KW - terahertz metamaterials
KW - thin film sensors
UR - http://www.scopus.com/inward/record.url?scp=85059810542&partnerID=8YFLogxK
UR - https://www.mendeley.com/catalogue/54d6ef6e-f494-3283-953e-9ffa65719f5e/
U2 - 10.23919/EuMC.2018.8541443
DO - 10.23919/EuMC.2018.8541443
M3 - Conference contribution
AN - SCOPUS:85059810542
SN - 9782874870514
T3 - 2018 48th European Microwave Conference, EuMC 2018
SP - 420
EP - 423
BT - 2018 48th European Microwave Conference, EuMC 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 48th European Microwave Conference, EuMC 2018
Y2 - 25 September 2018 through 27 September 2018
ER -
ID: 38059857