TY - GEN

T1 - An Accurate Equivalent-Circuit Analysis of an Angle-Selective Metasurface for THz Sensing

AU - Tumashov, M. A.

AU - Baena, J. D.

AU - Del Risco, J. P.

AU - Lazorskiy, P. A.

AU - Kuznetsov, S. A.

AU - Glybovski, S. B.

N1 - Conference code: 16

PY - 2023

Y1 - 2023

N2 - In this work, we propose an equivalent circuit that predicts the reflectance spectra of a resonant metasurface with a pronounced variation in the resonant frequency versus the incidence angle. Two different unit-cell geometries of such a metasurface are compared, and the possibility of using both for sensing of submicron-Thick films (analytes) is studied. In contrast to conventional metasurface sensors that rely on a spectral resonance shift, the angle-selective metasurface can be employed for sensing using a single-frequency THz source. The proposed circuit quantitatively predicts the reflectance spectra at different incidence angles and allows one to calculate the required angle of mechanical rotation of the metasurface that compensates for the resonance shift when a submicron analyte is deposited.

AB - In this work, we propose an equivalent circuit that predicts the reflectance spectra of a resonant metasurface with a pronounced variation in the resonant frequency versus the incidence angle. Two different unit-cell geometries of such a metasurface are compared, and the possibility of using both for sensing of submicron-Thick films (analytes) is studied. In contrast to conventional metasurface sensors that rely on a spectral resonance shift, the angle-selective metasurface can be employed for sensing using a single-frequency THz source. The proposed circuit quantitatively predicts the reflectance spectra at different incidence angles and allows one to calculate the required angle of mechanical rotation of the metasurface that compensates for the resonance shift when a submicron analyte is deposited.

KW - Angular selectivity

KW - Equivalent circuit

KW - Metasurface

KW - Single-frequency sensing

KW - THz-sensor

UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85179629848&origin=inward&txGid=b32f9264ab9d4322fc9e045dc9a5a61d

UR - https://www.mendeley.com/catalogue/a97cbbb1-7dfc-35f0-8f76-ce4bf24768d7/

U2 - 10.1109/TELSIKS57806.2023.10316159

DO - 10.1109/TELSIKS57806.2023.10316159

M3 - Conference contribution

SN - 9798350347029

T3 - 2023 International Conference on Advanced Technologies, Systems and Services in Telecommunications, TELSIKS 2023

SP - 30

EP - 33

BT - 2023 International Conference on Advanced Technologies, Systems and Services in Telecommunications, TELSIKS 2023

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 16th International Conference on Advanced Technologies, Systems and Services in Telecommunications

Y2 - 25 October 2023 through 27 October 2023

ER -