TY - JOUR

T1 - A Thin Layer Method for the LA-ICP-MS Analysis of Trace Element Concentrates

AU - Medvedev, N. S.

AU - Kurbatova, V. D.

AU - Saprykin, A. I.

N1 - The work was supported by the Ministry of Science and Higher Education of the Russian Federation, project no. 121031700315-2. Публикация для корректировки.

PY - 2023/3

Y1 - 2023/3

N2 - A method is proposed for the analysis of trace element concentrates by a thin layer method in combination with inductively coupled plasma mass spectrometry (ICP-MS) and laser ablation (LA). Trace elements concentrates were evaporated on preliminarily prepared areas of a high-purity silicon substrate, after which an LA-ICP-MS analysis was performed. The influence of the LA parameters and the conditions for recording the spectra on the signal of the analytes and the substrate material was studied. The analytical capabilities of the thin layer method in combination with LA-ICP-MS for the analysis of high-purity substances with the preconcentration of trace elements were evaluated. Using an analysis of high-purity nitric acid as an example, it was shown that the limits of detection for analytes in the LA-ICP-MS analysis of trace element concentrates using the thin layer method are in the range from n × 10–11 to n × 10–8 wt %. Thus, the development of combined procedures of analysis, including the preconcentration of trace elements and an analysis of concentrates by LA-ICP-MS, makes it possible to reduce the limits of detection for most analytes by one order of magnitude compared to instrumental ICP-MS analysis.

AB - A method is proposed for the analysis of trace element concentrates by a thin layer method in combination with inductively coupled plasma mass spectrometry (ICP-MS) and laser ablation (LA). Trace elements concentrates were evaporated on preliminarily prepared areas of a high-purity silicon substrate, after which an LA-ICP-MS analysis was performed. The influence of the LA parameters and the conditions for recording the spectra on the signal of the analytes and the substrate material was studied. The analytical capabilities of the thin layer method in combination with LA-ICP-MS for the analysis of high-purity substances with the preconcentration of trace elements were evaluated. Using an analysis of high-purity nitric acid as an example, it was shown that the limits of detection for analytes in the LA-ICP-MS analysis of trace element concentrates using the thin layer method are in the range from n × 10–11 to n × 10–8 wt %. Thus, the development of combined procedures of analysis, including the preconcentration of trace elements and an analysis of concentrates by LA-ICP-MS, makes it possible to reduce the limits of detection for most analytes by one order of magnitude compared to instrumental ICP-MS analysis.

KW - high-purity substances

KW - inductively coupled plasma

KW - laser ablation

KW - mass spectrometry

KW - preconcentration of trace element

KW - thin layer method

UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85158822407&origin=inward&txGid=5360cb0d5eaf31721fc78ced9278d476

UR - https://www.mendeley.com/catalogue/45d3f3d3-30cc-3fa9-a5e3-e672910389f9/

U2 - 10.1134/S1061934823030097

DO - 10.1134/S1061934823030097

M3 - Article

VL - 78

SP - 316

EP - 323

JO - Journal of Analytical Chemistry

JF - Journal of Analytical Chemistry

SN - 1061-9348

IS - 3

ER -