Original languageEnglish
Title of host publicationInternational Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM
PublisherIEEE Computer Society
Pages1770-1773
Number of pages4
ISBN (Print)9781665477376
DOIs
Publication statusPublished - 8 Aug 2025
Event2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM) - Алтай, Russian Federation
Duration: 27 Jun 20251 Jul 2025
Conference number: 26
https://edm.ieeesiberia.org/

Publication series

NameInternational Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM

Conference

Conference2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM)
Abbreviated titleEDM 2025
Country/TerritoryRussian Federation
CityАлтай
Period27.06.202501.07.2025
Internet address

    OECD FOS+WOS

  • 1.02 COMPUTER AND INFORMATION SCIENCES

    Research areas

  • autistic traits, autistic traits model, non-clinical study, personality traits, test validization

ID: 68949729