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The Effect of Fluid Properties on Two-Phase Regimes of Flow in a Wide Rectangular Microchannel. / Ronshin, F. V.; Cheverda, V. V.; Chinnov, E. A. et al.

In: Technical Physics Letters, Vol. 44, No. 4, 01.04.2018, p. 305-308.

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Ronshin FV, Cheverda VV, Chinnov EA, Kabov OA. The Effect of Fluid Properties on Two-Phase Regimes of Flow in a Wide Rectangular Microchannel. Technical Physics Letters. 2018 Apr 1;44(4):305-308. doi: 10.1134/S1063785018040089

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Ronshin, F. V. ; Cheverda, V. V. ; Chinnov, E. A. et al. / The Effect of Fluid Properties on Two-Phase Regimes of Flow in a Wide Rectangular Microchannel. In: Technical Physics Letters. 2018 ; Vol. 44, No. 4. pp. 305-308.

BibTeX

@article{79f7040aeb054825a535682b553a609d,
title = "The Effect of Fluid Properties on Two-Phase Regimes of Flow in a Wide Rectangular Microchannel",
abstract = "We have experimentally studied a two-phase flow in a microchannel with a height of 150 μm and a width of 20 mm. Different liquids have been used, namely, a purified Milli-Q water, an 50% aqueous-ethanol solution, and FC-72. Before and after the experiment, the height of the microchannel was controlled, as well as the wettability of its walls and surface tension of liquids. Using the schlieren method, the main characteristics of two-phase flow in wide ranges of gas- and liquid-flow rates have been revealed. The flow regime-formation mechanism has been found to depend on the properties of the liquid used. The flow regime has been registered when the droplets moving along the microchannel are vertical liquid bridges. It has been shown that, when using FC-72 liquid, a film of liquid is formed on the upper channel wall in the whole range of gas- and liquid-flow rates.",
author = "Ronshin, {F. V.} and Cheverda, {V. V.} and Chinnov, {E. A.} and Kabov, {O. A.}",
year = "2018",
month = apr,
day = "1",
doi = "10.1134/S1063785018040089",
language = "English",
volume = "44",
pages = "305--308",
journal = "Technical Physics Letters",
issn = "1063-7850",
publisher = "PLEIADES PUBLISHING INC",
number = "4",

}

RIS

TY - JOUR

T1 - The Effect of Fluid Properties on Two-Phase Regimes of Flow in a Wide Rectangular Microchannel

AU - Ronshin, F. V.

AU - Cheverda, V. V.

AU - Chinnov, E. A.

AU - Kabov, O. A.

PY - 2018/4/1

Y1 - 2018/4/1

N2 - We have experimentally studied a two-phase flow in a microchannel with a height of 150 μm and a width of 20 mm. Different liquids have been used, namely, a purified Milli-Q water, an 50% aqueous-ethanol solution, and FC-72. Before and after the experiment, the height of the microchannel was controlled, as well as the wettability of its walls and surface tension of liquids. Using the schlieren method, the main characteristics of two-phase flow in wide ranges of gas- and liquid-flow rates have been revealed. The flow regime-formation mechanism has been found to depend on the properties of the liquid used. The flow regime has been registered when the droplets moving along the microchannel are vertical liquid bridges. It has been shown that, when using FC-72 liquid, a film of liquid is formed on the upper channel wall in the whole range of gas- and liquid-flow rates.

AB - We have experimentally studied a two-phase flow in a microchannel with a height of 150 μm and a width of 20 mm. Different liquids have been used, namely, a purified Milli-Q water, an 50% aqueous-ethanol solution, and FC-72. Before and after the experiment, the height of the microchannel was controlled, as well as the wettability of its walls and surface tension of liquids. Using the schlieren method, the main characteristics of two-phase flow in wide ranges of gas- and liquid-flow rates have been revealed. The flow regime-formation mechanism has been found to depend on the properties of the liquid used. The flow regime has been registered when the droplets moving along the microchannel are vertical liquid bridges. It has been shown that, when using FC-72 liquid, a film of liquid is formed on the upper channel wall in the whole range of gas- and liquid-flow rates.

UR - http://www.scopus.com/inward/record.url?scp=85047399567&partnerID=8YFLogxK

U2 - 10.1134/S1063785018040089

DO - 10.1134/S1063785018040089

M3 - Article

AN - SCOPUS:85047399567

VL - 44

SP - 305

EP - 308

JO - Technical Physics Letters

JF - Technical Physics Letters

SN - 1063-7850

IS - 4

ER -

ID: 13594793