Research output: Contribution to journal › Article › peer-review
Spectral detection of spin-polarized ultra low-energy electrons in semiconductor heterostructures. / Golyashov, V. A.; Rusetsky, V. S.; Shamirzaev, T. S. et al.
In: Ultramicroscopy, Vol. 218, 113076, 01.11.2020.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Spectral detection of spin-polarized ultra low-energy electrons in semiconductor heterostructures
AU - Golyashov, V. A.
AU - Rusetsky, V. S.
AU - Shamirzaev, T. S.
AU - Dmitriev, D. V.
AU - Kislykh, N. V.
AU - Mironov, A. V.
AU - Aksenov, V. V.
AU - Tereshchenko, O. E.
N1 - Copyright © 2020 Elsevier B.V. All rights reserved.
PY - 2020/11/1
Y1 - 2020/11/1
N2 - The circularly polarized cathodoluminescence (CL) technique has been used to study the free spin-polarized electron injection in semiconductor heterostructures with quantum wells (QWs). A polarized electron beam was created by the emission of optically oriented electrons from the p-GaAs(Cs,O) negative electron affinity (NEA) photocathode. The prepared beam was injected in a semiconductor QW target, which was activated by cesium and oxygen to reduce the work function. To study the spin-dependent injection, we developed a spin-detector prototype, which consists of a compact proximity focused vacuum tube with the source and target placed parallel to each other on the opposite ends of the vacuum tube (photodiode). The injection of polarized low-energy electrons into the target by varying the kinetic energy in the range of 0.5-5.0 eV and temperature in the range of 90-300 K was studied. The CL was polarized to 2 % by the injection of 20 % spin-polarized electron beam with the energy of 0.5 eV at room temperature. The asymmetry (Sherman function) of spin detection was estimated. It was shown that the dependence of the CL polarization degree on the injected electron energy is satisfactory described by the model that considers the electron spin relaxation in the heterostructure matrix and QWs. The results demonstrate that semiconductor detectors are promising for the spin-polarimetry applications based on the optical detection of free-electron spin polarization.
AB - The circularly polarized cathodoluminescence (CL) technique has been used to study the free spin-polarized electron injection in semiconductor heterostructures with quantum wells (QWs). A polarized electron beam was created by the emission of optically oriented electrons from the p-GaAs(Cs,O) negative electron affinity (NEA) photocathode. The prepared beam was injected in a semiconductor QW target, which was activated by cesium and oxygen to reduce the work function. To study the spin-dependent injection, we developed a spin-detector prototype, which consists of a compact proximity focused vacuum tube with the source and target placed parallel to each other on the opposite ends of the vacuum tube (photodiode). The injection of polarized low-energy electrons into the target by varying the kinetic energy in the range of 0.5-5.0 eV and temperature in the range of 90-300 K was studied. The CL was polarized to 2 % by the injection of 20 % spin-polarized electron beam with the energy of 0.5 eV at room temperature. The asymmetry (Sherman function) of spin detection was estimated. It was shown that the dependence of the CL polarization degree on the injected electron energy is satisfactory described by the model that considers the electron spin relaxation in the heterostructure matrix and QWs. The results demonstrate that semiconductor detectors are promising for the spin-polarimetry applications based on the optical detection of free-electron spin polarization.
KW - Angle-resolved photoemission spectroscopy
KW - Circularly polarized cathodoluminescence
KW - Electron spin polarization
KW - Negative electron affinity
KW - Spin-detector
KW - DEPENDENT TRANSMISSION
KW - GAAS
UR - http://www.scopus.com/inward/record.url?scp=85088844518&partnerID=8YFLogxK
U2 - 10.1016/j.ultramic.2020.113076
DO - 10.1016/j.ultramic.2020.113076
M3 - Article
C2 - 32738565
AN - SCOPUS:85088844518
VL - 218
JO - Ultramicroscopy
JF - Ultramicroscopy
SN - 0304-3991
M1 - 113076
ER -
ID: 24949635