Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
Single-Bunch Monitor of the Position and Intensity of the SR Beam for Station "Fast Processes" of the Synchrotron Radiation Facility "SKIF". / Kornievskiy, Maxim A.; Aulchenko, Vladimir M.; Glushak, Anastasia A. et al.
Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023. Institute of Electrical and Electronics Engineers (IEEE), 2023. p. 900-905.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
}
TY - GEN
T1 - Single-Bunch Monitor of the Position and Intensity of the SR Beam for Station "Fast Processes" of the Synchrotron Radiation Facility "SKIF"
AU - Kornievskiy, Maxim A.
AU - Aulchenko, Vladimir M.
AU - Glushak, Anastasia A.
AU - Shekhtman, Lev I.
N1 - Conference code: 16
PY - 2023
Y1 - 2023
N2 - The design of a fast monitor of the synchrotron radiation beam position and intensity is described in the paper, which is being created for the station 1-3 "Fast Processes" of the synchrotron radiation facility “SKIF”. This monitor will be used for correction of the results of the measurements performed with the specialized detector for experiments with fast processes. Such corrections are necessary because the bunches in the storage ring have different currents and might have different positions and angles during their passage through the wiggler. The monitor will consist of 4 channels, in each channel the signal is formed by current pulses. Each channel will include an integration circuit to convert current into voltage, and an analogue-to-digital converter to digitize the received signal. The digitized signal will be fed into a programmable logic integrated circuit, after which it will be sent to a computer via Ethernet interface. This article describes the operating principles of the device, as well as the results obtained so far.
AB - The design of a fast monitor of the synchrotron radiation beam position and intensity is described in the paper, which is being created for the station 1-3 "Fast Processes" of the synchrotron radiation facility “SKIF”. This monitor will be used for correction of the results of the measurements performed with the specialized detector for experiments with fast processes. Such corrections are necessary because the bunches in the storage ring have different currents and might have different positions and angles during their passage through the wiggler. The monitor will consist of 4 channels, in each channel the signal is formed by current pulses. Each channel will include an integration circuit to convert current into voltage, and an analogue-to-digital converter to digitize the received signal. The digitized signal will be fed into a programmable logic integrated circuit, after which it will be sent to a computer via Ethernet interface. This article describes the operating principles of the device, as well as the results obtained so far.
UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85182260511&origin=inward&txGid=f9800944c7974545068a44302b76fa52
UR - https://www.mendeley.com/catalogue/fbbd0c58-0d37-3631-a063-a5bb961d2401/
U2 - 10.1109/apeie59731.2023.10347728
DO - 10.1109/apeie59731.2023.10347728
M3 - Conference contribution
SN - 9798350330885
SP - 900
EP - 905
BT - Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023
PB - Institute of Electrical and Electronics Engineers (IEEE)
T2 - 16th IEEE International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering
Y2 - 10 November 2023 through 12 November 2023
ER -
ID: 59614312