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Silicon diffractive optical element with piecewise continuous profile to focus high-power terahertz radiation into a square area. / Komlenok, Maxim S.; Kononenko, Taras V.; Konov, Vitaly I. et al.

In: Journal of the Optical Society of America B: Optical Physics, Vol. 38, No. 8, 2021, p. B9-B13.

Research output: Contribution to journal › Article › peer-review

Harvard

Komlenok, MS, Kononenko, TV, Konov, VI, Choporova, YY, Osintseva, ND, Knyazev, BA, Pavelyev, VS, Tukmakov, KN & Soifer, VA 2021, 'Silicon diffractive optical element with piecewise continuous profile to focus high-power terahertz radiation into a square area', Journal of the Optical Society of America B: Optical Physics, vol. 38, no. 8, pp. B9-B13. https://doi.org/10.1364/JOSAB.425286

APA

Komlenok, M. S., Kononenko, T. V., Konov, V. I., Choporova, Y. Y., Osintseva, N. D., Knyazev, B. A., Pavelyev, V. S., Tukmakov, K. N., & Soifer, V. A. (2021). Silicon diffractive optical element with piecewise continuous profile to focus high-power terahertz radiation into a square area. Journal of the Optical Society of America B: Optical Physics, 38(8), B9-B13. https://doi.org/10.1364/JOSAB.425286

Vancouver

Komlenok MS, Kononenko TV, Konov VI, Choporova YY, Osintseva ND, Knyazev BA et al. Silicon diffractive optical element with piecewise continuous profile to focus high-power terahertz radiation into a square area. Journal of the Optical Society of America B: Optical Physics. 2021;38(8):B9-B13. doi: 10.1364/JOSAB.425286

Author

Komlenok, Maxim S. ; Kononenko, Taras V. ; Konov, Vitaly I. et al. / Silicon diffractive optical element with piecewise continuous profile to focus high-power terahertz radiation into a square area. In: Journal of the Optical Society of America B: Optical Physics. 2021 ; Vol. 38, No. 8. pp. B9-B13.

BibTeX

@article{1e542aabe62340d0a9b14d0b49d7dca7,
title = "Silicon diffractive optical element with piecewise continuous profile to focus high-power terahertz radiation into a square area",
abstract = "A technique of high-frequency laser ablation using a 2D beam scanner has been designed and applied to creation of a silicon diffractive optical element (DOE) with a continuous profile to focus a terahertz Gaussian beam into a square region. The microrelief of the resulting silicon DOE has been analyzed with a white-light interferometer and a scanning electron microscope. The distribution of radiation behind the DOE illuminated by a high-power beam of the Novosibirsk free-electron laser at a wavelength of 130 µm, recorded with a pyroelectric camera, has been demonstrated. The measured diffraction efficiency of the DOE is equal to 97 ± 2%.",
author = "Komlenok, {Maxim S.} and Kononenko, {Taras V.} and Konov, {Vitaly I.} and Choporova, {Yulia Yu} and Osintseva, {Natalya D.} and Knyazev, {Boris A.} and Pavelyev, {Vladimir S.} and Tukmakov, {Konstantin N.} and Soifer, {Victor A.}",
note = "Funding Information: Funding. Russian Foundation for Basic Research (17-32-50094); Siberian Branch, Russian Academy of Sciences (NovoFEL); Ministry of Science and Higher Education of the Russian Federation (FSRC “Crystallography and Photonics” RAS). Funding Information: Acknowledgment. This work was supported by the Russian Foundation for Basic Research. The surface morphology analysis by scanning electron microscopy was supported by the Ministry of Science and Higher Education within the government project of the FSRC Crystallography and Photonics RAS. The experiments were carried out using the infrastructure of the shared research facility Siberian Synchrotron and Terahertz Radiation Center (SSTRC), based on NovoFEL at BINP SB RAS. Publisher Copyright: {\textcopyright} 2021 Optical Society of America Copyright: Copyright 2021 Elsevier B.V., All rights reserved.",
year = "2021",
doi = "10.1364/JOSAB.425286",
language = "English",
volume = "38",
pages = "B9--B13",
journal = "Journal of the Optical Society of America B: Optical Physics",
issn = "0740-3224",
publisher = "OPTICAL SOC AMER",
number = "8",

}

RIS

TY - JOUR

T1 - Silicon diffractive optical element with piecewise continuous profile to focus high-power terahertz radiation into a square area

AU - Komlenok, Maxim S.

AU - Kononenko, Taras V.

AU - Konov, Vitaly I.

AU - Choporova, Yulia Yu

AU - Osintseva, Natalya D.

AU - Knyazev, Boris A.

AU - Pavelyev, Vladimir S.

AU - Tukmakov, Konstantin N.

AU - Soifer, Victor A.

N1 - Funding Information: Funding. Russian Foundation for Basic Research (17-32-50094); Siberian Branch, Russian Academy of Sciences (NovoFEL); Ministry of Science and Higher Education of the Russian Federation (FSRC “Crystallography and Photonics” RAS). Funding Information: Acknowledgment. This work was supported by the Russian Foundation for Basic Research. The surface morphology analysis by scanning electron microscopy was supported by the Ministry of Science and Higher Education within the government project of the FSRC Crystallography and Photonics RAS. The experiments were carried out using the infrastructure of the shared research facility Siberian Synchrotron and Terahertz Radiation Center (SSTRC), based on NovoFEL at BINP SB RAS. Publisher Copyright: © 2021 Optical Society of America Copyright: Copyright 2021 Elsevier B.V., All rights reserved.

PY - 2021

Y1 - 2021

N2 - A technique of high-frequency laser ablation using a 2D beam scanner has been designed and applied to creation of a silicon diffractive optical element (DOE) with a continuous profile to focus a terahertz Gaussian beam into a square region. The microrelief of the resulting silicon DOE has been analyzed with a white-light interferometer and a scanning electron microscope. The distribution of radiation behind the DOE illuminated by a high-power beam of the Novosibirsk free-electron laser at a wavelength of 130 µm, recorded with a pyroelectric camera, has been demonstrated. The measured diffraction efficiency of the DOE is equal to 97 ± 2%.

AB - A technique of high-frequency laser ablation using a 2D beam scanner has been designed and applied to creation of a silicon diffractive optical element (DOE) with a continuous profile to focus a terahertz Gaussian beam into a square region. The microrelief of the resulting silicon DOE has been analyzed with a white-light interferometer and a scanning electron microscope. The distribution of radiation behind the DOE illuminated by a high-power beam of the Novosibirsk free-electron laser at a wavelength of 130 µm, recorded with a pyroelectric camera, has been demonstrated. The measured diffraction efficiency of the DOE is equal to 97 ± 2%.

UR - http://www.scopus.com/inward/record.url?scp=85107599584&partnerID=8YFLogxK

U2 - 10.1364/JOSAB.425286

DO - 10.1364/JOSAB.425286

M3 - Article

AN - SCOPUS:85107599584

VL - 38

SP - B9-B13

JO - Journal of the Optical Society of America B: Optical Physics

JF - Journal of the Optical Society of America B: Optical Physics

SN - 0740-3224

IS - 8

ER -

ID: 28887445