Standard

Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range. / Nikitin, A. K.; Khitrov, O. V.; Gerasimov, V. V.

In: Journal of Physics: Conference Series, Vol. 1636, No. 1, 012037, 09.10.2020.

Research output: Contribution to journal › Conference article › peer-review

Harvard

Nikitin, AK, Khitrov, OV & Gerasimov, VV 2020, 'Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range', Journal of Physics: Conference Series, vol. 1636, no. 1, 012037. https://doi.org/10.1088/1742-6596/1636/1/012037

APA

Nikitin, A. K., Khitrov, O. V., & Gerasimov, V. V. (2020). Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range. Journal of Physics: Conference Series, 1636(1), [012037]. https://doi.org/10.1088/1742-6596/1636/1/012037

Vancouver

Nikitin AK, Khitrov OV, Gerasimov VV. Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range. Journal of Physics: Conference Series. 2020 Oct 9;1636(1):012037. doi: 10.1088/1742-6596/1636/1/012037

Author

Nikitin, A. K. ; Khitrov, O. V. ; Gerasimov, V. V. / Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range. In: Journal of Physics: Conference Series. 2020 ; Vol. 1636, No. 1.

BibTeX

@article{b51f9c6f61e64b6382e2ea4f24d41361,
title = "Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range",
abstract = "The article considers the possibility of controlling the quality of a conducting surface using a Michelson interferometer, in which the information carrier is surface plasmon-polaritons (a type of surface electromagnetic waves) of the terahertz range. It is shown that using such an interferometer, it is possible both to control the uniformity of the dielectric coating on the surface of a metal product, and to detect inhomogeneities on the controlled surface, as well as to evaluate their geometric and optical characteristics.",
author = "Nikitin, {A. K.} and Khitrov, {O. V.} and Gerasimov, {V. V.}",
year = "2020",
month = oct,
day = "9",
doi = "10.1088/1742-6596/1636/1/012037",
language = "English",
volume = "1636",
journal = "Journal of Physics: Conference Series",
issn = "1742-6588",
publisher = "IOP Publishing Ltd.",
number = "1",
note = "22nd Russian National Conference on Non-Destructive Testing and Technical Diagnostics: Transformation of Non-Destructive Testing and Technical Diagnostics in the Era of Digitalization. Society Security in a Changing World, RNCNDTTD 2020 ; Conference date: 03-03-2020 Through 05-03-2020",

}

RIS

TY - JOUR

T1 - Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range

AU - Nikitin, A. K.

AU - Khitrov, O. V.

AU - Gerasimov, V. V.

PY - 2020/10/9

Y1 - 2020/10/9

N2 - The article considers the possibility of controlling the quality of a conducting surface using a Michelson interferometer, in which the information carrier is surface plasmon-polaritons (a type of surface electromagnetic waves) of the terahertz range. It is shown that using such an interferometer, it is possible both to control the uniformity of the dielectric coating on the surface of a metal product, and to detect inhomogeneities on the controlled surface, as well as to evaluate their geometric and optical characteristics.

AB - The article considers the possibility of controlling the quality of a conducting surface using a Michelson interferometer, in which the information carrier is surface plasmon-polaritons (a type of surface electromagnetic waves) of the terahertz range. It is shown that using such an interferometer, it is possible both to control the uniformity of the dielectric coating on the surface of a metal product, and to detect inhomogeneities on the controlled surface, as well as to evaluate their geometric and optical characteristics.

UR - http://www.scopus.com/inward/record.url?scp=85092616908&partnerID=8YFLogxK

U2 - 10.1088/1742-6596/1636/1/012037

DO - 10.1088/1742-6596/1636/1/012037

M3 - Conference article

AN - SCOPUS:85092616908

VL - 1636

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

SN - 1742-6588

IS - 1

M1 - 012037

T2 - 22nd Russian National Conference on Non-Destructive Testing and Technical Diagnostics: Transformation of Non-Destructive Testing and Technical Diagnostics in the Era of Digitalization. Society Security in a Changing World, RNCNDTTD 2020

Y2 - 3 March 2020 through 5 March 2020

ER -

ID: 25645715