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Multi-Modal Fusion of EEG and Genetic Markers for Depression Prediction from ICBrainDB. / Firoz, Neda; Berestneva, Olga Grigorievna; Savostyanov, Alexander et al.

2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE). Institute of Electrical and Electronics Engineers Inc., 2025. p. 1-9.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Harvard

Firoz, N, Berestneva, OG, Savostyanov, A & Aksyonov, SV 2025, Multi-Modal Fusion of EEG and Genetic Markers for Depression Prediction from ICBrainDB. in 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE). Institute of Electrical and Electronics Engineers Inc., pp. 1-9, 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering, Новосибирск, Russian Federation, 14.11.2025. https://doi.org/10.1109/apeie66761.2025.11289224

APA

Firoz, N., Berestneva, O. G., Savostyanov, A., & Aksyonov, S. V. (2025). Multi-Modal Fusion of EEG and Genetic Markers for Depression Prediction from ICBrainDB. In 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE) (pp. 1-9). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/apeie66761.2025.11289224

Vancouver

Firoz N, Berestneva OG, Savostyanov A, Aksyonov SV. Multi-Modal Fusion of EEG and Genetic Markers for Depression Prediction from ICBrainDB. In 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE). Institute of Electrical and Electronics Engineers Inc. 2025. p. 1-9 doi: 10.1109/apeie66761.2025.11289224

Author

Firoz, Neda ; Berestneva, Olga Grigorievna ; Savostyanov, Alexander et al. / Multi-Modal Fusion of EEG and Genetic Markers for Depression Prediction from ICBrainDB. 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE). Institute of Electrical and Electronics Engineers Inc., 2025. pp. 1-9

BibTeX

@inproceedings{9c21b2bade5a4f51a59d05e883ee1bdc,
title = "Multi-Modal Fusion of EEG and Genetic Markers for Depression Prediction from ICBrainDB",
abstract = "Major depressive disorder (MDD) remains a leading cause of disability worldwide, yet current diagnostic approaches rely heavily on subjective clinical assessments, which can delay intervention and reduce diagnostic reliability. Objective, multimodal biomarkers offer a promising route toward earlier and more accurate detection. Electroencephalography (EEG) captures real-time neural dynamics, while genetic biomarkers provide stable indicators of molecular predisposition, offering complementary perspectives on depression risk. This study introduces EEG–Gene Fusion Depression Network (EGF-DepNet), the first end-to-end deep learning framework to integrate EEG-derived features and gene-based biomarkers for depression prediction. Two fusion strategies are proposed: (i) an Attention Fusion model employing cross-modal MultiHeadAttention within a compact Conv1D network, and (ii) a Transformer Fusion model that encodes EEG and genomic embeddings as tokens in a lightweight self-attention encoder. Using the ICBrainDB dataset, both architectures achieved high predictive performance, with Transformer Fusion outperforming Attention Fusion across multiple evaluation metrics, including F1-score (0.727 vs. 0.600) and AUC (0.845 vs. 0.749). Results demonstrate that multimodal EEG–genomic integration improves classification robustness over unimodal approaches, effectively leveraging the temporal sensitivity of EEG and the trait stability of genetic markers. This work advances the development of biologically informed, AI-driven diagnostic tools, offering a pathway toward more precise, scalable, and personalized approaches in precision psychiatry.",
keywords = "электроэнцефалография, генетические биомаркеры, мультимодальная интеграция, прогнозирование депрессии, трансформер, модели внимания, EEG, Genetic biomarker, Multimodal fusion, Depression prediction, Transformer, Attention Models",
author = "Neda Firoz and Berestneva, {Olga Grigorievna} and Alexander Savostyanov and Aksyonov, {Sergey Vladimirovich}",
note = "N. Firoz, O. G. Berestneva, A. Savostyanov and S. V. Aksyonov, {"}Multi-Modal Fusion of EEG and Genetic Markers for Depression Prediction from ICBrainDB,{"} 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE), Novosibirsk, Russian Federation, 2025, pp. 1-9, doi: 10.1109/APEIE66761.2025.11289224. We sincerely acknowledge the ICBrainDB dataset and its contributors, with special thanks to Professor Alexander Savostyanov for providing access. The dataset includes participants{\textquoteright} genetic information, the collection and analysis of which were carried out under the budget project of the ICG SB RAS (No. FWNR-2022-0020). The research was also carried out with the support of a grant from the Government of the Russian Federation (Agreement No. 075-15-2025-009 of 28 February 2025).; 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering, APEIE ; Conference date: 14-11-2025 Through 16-11-2025",
year = "2025",
month = dec,
day = "18",
doi = "10.1109/apeie66761.2025.11289224",
language = "English",
isbn = "979-8-3315-5917-5",
pages = "1--9",
booktitle = "2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE)",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",

}

RIS

TY - GEN

T1 - Multi-Modal Fusion of EEG and Genetic Markers for Depression Prediction from ICBrainDB

AU - Firoz, Neda

AU - Berestneva, Olga Grigorievna

AU - Savostyanov, Alexander

AU - Aksyonov, Sergey Vladimirovich

N1 - Conference code: 17

PY - 2025/12/18

Y1 - 2025/12/18

N2 - Major depressive disorder (MDD) remains a leading cause of disability worldwide, yet current diagnostic approaches rely heavily on subjective clinical assessments, which can delay intervention and reduce diagnostic reliability. Objective, multimodal biomarkers offer a promising route toward earlier and more accurate detection. Electroencephalography (EEG) captures real-time neural dynamics, while genetic biomarkers provide stable indicators of molecular predisposition, offering complementary perspectives on depression risk. This study introduces EEG–Gene Fusion Depression Network (EGF-DepNet), the first end-to-end deep learning framework to integrate EEG-derived features and gene-based biomarkers for depression prediction. Two fusion strategies are proposed: (i) an Attention Fusion model employing cross-modal MultiHeadAttention within a compact Conv1D network, and (ii) a Transformer Fusion model that encodes EEG and genomic embeddings as tokens in a lightweight self-attention encoder. Using the ICBrainDB dataset, both architectures achieved high predictive performance, with Transformer Fusion outperforming Attention Fusion across multiple evaluation metrics, including F1-score (0.727 vs. 0.600) and AUC (0.845 vs. 0.749). Results demonstrate that multimodal EEG–genomic integration improves classification robustness over unimodal approaches, effectively leveraging the temporal sensitivity of EEG and the trait stability of genetic markers. This work advances the development of biologically informed, AI-driven diagnostic tools, offering a pathway toward more precise, scalable, and personalized approaches in precision psychiatry.

AB - Major depressive disorder (MDD) remains a leading cause of disability worldwide, yet current diagnostic approaches rely heavily on subjective clinical assessments, which can delay intervention and reduce diagnostic reliability. Objective, multimodal biomarkers offer a promising route toward earlier and more accurate detection. Electroencephalography (EEG) captures real-time neural dynamics, while genetic biomarkers provide stable indicators of molecular predisposition, offering complementary perspectives on depression risk. This study introduces EEG–Gene Fusion Depression Network (EGF-DepNet), the first end-to-end deep learning framework to integrate EEG-derived features and gene-based biomarkers for depression prediction. Two fusion strategies are proposed: (i) an Attention Fusion model employing cross-modal MultiHeadAttention within a compact Conv1D network, and (ii) a Transformer Fusion model that encodes EEG and genomic embeddings as tokens in a lightweight self-attention encoder. Using the ICBrainDB dataset, both architectures achieved high predictive performance, with Transformer Fusion outperforming Attention Fusion across multiple evaluation metrics, including F1-score (0.727 vs. 0.600) and AUC (0.845 vs. 0.749). Results demonstrate that multimodal EEG–genomic integration improves classification robustness over unimodal approaches, effectively leveraging the temporal sensitivity of EEG and the trait stability of genetic markers. This work advances the development of biologically informed, AI-driven diagnostic tools, offering a pathway toward more precise, scalable, and personalized approaches in precision psychiatry.

KW - электроэнцефалография

KW - генетические биомаркеры

KW - мультимодальная интеграция

KW - прогнозирование депрессии

KW - трансформер

KW - модели внимания

KW - EEG

KW - Genetic biomarker

KW - Multimodal fusion

KW - Depression prediction

KW - Transformer

KW - Attention Models

UR - https://www.scopus.com/pages/publications/105031777048

UR - https://www.mendeley.com/catalogue/de5d9a7a-8c7e-3a6b-b659-468f62297df5/

U2 - 10.1109/apeie66761.2025.11289224

DO - 10.1109/apeie66761.2025.11289224

M3 - Conference contribution

SN - 979-8-3315-5917-5

SP - 1

EP - 9

BT - 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE)

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering

Y2 - 14 November 2025 through 16 November 2025

ER -

ID: 75600742