Localization of Excitons on Planar Defects in Semiconductor Crystals › Research Explorer

DOI

https://doi.org/10.1134/S0021364020160080
Final published version

Original language	English
Pages (from-to)	230-233
Number of pages	4
Journal	JETP Letters
Volume	112
Issue number	4
DOIs	https://doi.org/10.1134/S0021364020160080
Publication status	Published - 1 Aug 2020

Research areas

STATE, WELL

OECD FOS+WOS

ID: 25851108