Research output: Contribution to journal › Conference article › peer-review
In-plane interferometry of terahertz surface plasmon polaritons. / Nikitin, A. K.; Khitrov, O. V.; Gerasimov, V. V. et al.
In: Journal of Physics: Conference Series, Vol. 1421, No. 1, 012013, 30.12.2019.Research output: Contribution to journal › Conference article › peer-review
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TY - JOUR
T1 - In-plane interferometry of terahertz surface plasmon polaritons
AU - Nikitin, A. K.
AU - Khitrov, O. V.
AU - Gerasimov, V. V.
AU - Khasanov, I. Sh
AU - Ryzhova, T. A.
PY - 2019/12/30
Y1 - 2019/12/30
N2 - The paper is devoted to the development of interferometric schemes for determining the complex refractive index κ = κ′+i•κ″ κ of surface plasmon-polaritons (SPPs) of the terahertz (THz) spectral range. As the value of κ depends on the dielectric constant ϵm of the metal surface guiding the SPPs it can be used for determining m in the far infrared what other optical methods fail to do due to high reflectivity of metals. We discuss two types of THz SPP interferometers in which the interference pattern is formed as a result of the interaction of SPP beams themselves rather than bulk waves produced by these beams. The first type of interferometers are static devices that enable one to investigate fast processes on the metal surface, while the second type are dynamic ones that make it possible to realize Fourier spectroscopy of the metal surface and its transition layer at THz frequencies. Devices of the both types produce interferograms enabling one to determine the real and the imaginary parts of κ. The results of experiments on the interaction of THz SPPs with flat mirrors and beam - splitting plates, the key elements of the THz SPP interferometers, are presented.
AB - The paper is devoted to the development of interferometric schemes for determining the complex refractive index κ = κ′+i•κ″ κ of surface plasmon-polaritons (SPPs) of the terahertz (THz) spectral range. As the value of κ depends on the dielectric constant ϵm of the metal surface guiding the SPPs it can be used for determining m in the far infrared what other optical methods fail to do due to high reflectivity of metals. We discuss two types of THz SPP interferometers in which the interference pattern is formed as a result of the interaction of SPP beams themselves rather than bulk waves produced by these beams. The first type of interferometers are static devices that enable one to investigate fast processes on the metal surface, while the second type are dynamic ones that make it possible to realize Fourier spectroscopy of the metal surface and its transition layer at THz frequencies. Devices of the both types produce interferograms enabling one to determine the real and the imaginary parts of κ. The results of experiments on the interaction of THz SPPs with flat mirrors and beam - splitting plates, the key elements of the THz SPP interferometers, are presented.
UR - http://www.scopus.com/inward/record.url?scp=85078254508&partnerID=8YFLogxK
U2 - 10.1088/1742-6596/1421/1/012013
DO - 10.1088/1742-6596/1421/1/012013
M3 - Conference article
AN - SCOPUS:85078254508
VL - 1421
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
SN - 1742-6588
IS - 1
M1 - 012013
T2 - 15th International Conference on Optical Methods of Flow Investigation, OMFI 2019
Y2 - 24 June 2019 through 28 June 2019
ER -
ID: 23257038