DOI

  • Yahor V. Lebiadok
  • Alena A. Razumets
  • Tatyana V. Bezyazychnaya
  • Ivan A. Aleksandrov
  • Konstantin S. Zhuravlev
Original languageEnglish
Article number043512
Number of pages7
JournalJournal of Nanophotonics
Volume12
Issue number4
DOIs
Publication statusPublished - 1 Oct 2018

    OECD FOS+WOS

    Research areas

  • AlN, GaN, Interface, Point defect, GAN, interface, point defect

ID: 15965417