• A. A. Dobretsova
  • Z. D. Kvon
  • L. S. Braginskii
  • M. V. Entin
  • N. N. Mikhailov
Original languageEnglish
Pages (from-to)1468-1472
Number of pages5
JournalSemiconductors
Volume52
Issue number11
DOIs
Publication statusPublished - 1 Nov 2018

    Research areas

  • SCATTERING, ROUGHNESS, FERMIONS

    OECD FOS+WOS

ID: 17233294