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Fundamental characteristic length scale for the field dependence of hopping charge transport in disordered organic semiconductors
Research output
:
Contribution to journal
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Article
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peer-review
Semiconductor Physics Section
Overview
Cite this
DOI
https://doi.org/10.1103/PhysRevB.96.035204
Final published version
A. V. Nenashev
J. O. Oelerich
A. V. Dvurechenskii
F. Gebhard
S. D. Baranovskii
Original language
English
Article number
035204
Number of pages
7
Journal
Physical Review B
Volume
96
Issue number
3
DOIs
https://doi.org/10.1103/PhysRevB.96.035204
Publication status
Published -
21 Jul 2017
Research areas
CARRIER TRANSPORT, EFFECTIVE TEMPERATURE, DOPED POLYMERS, BAND TAILS, SOLIDS, RECOMBINATION, ELECTRONS
OECD FOS+WOS
ID: 9979195