Frustration of total internal reflection by a hidden nanowire › Research Explorer

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Frustration of total internal reflection by a hidden nanowire

Research output: Contribution to journal › Conference article › peer-review

DOI

https://doi.org/10.1051/epjconf/201713202021
Final published version

Original language	English
Article number	02021
Number of pages	2
Journal	EPJ Web of Conferences
Volume	132
DOIs	https://doi.org/10.1051/epjconf/201713202021
Publication status	Published - 1 Jan 2017

OECD FOS+WOS

Research areas

NEAR-FIELD, MICROSCOPY, SCATTERING, PHYSICS

ID: 10270461