Express Characterization of Crystalline Perfection of CdxHg1−xTe Structures by Reflection Second Harmonic Generation of Probing Radiation › Research Explorer

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Express Characterization of Crystalline Perfection of Cd_xHg_1−xTe Structures by Reflection Second Harmonic Generation of Probing Radiation

Research output: Contribution to journal › Article › peer-review

DOI

https://doi.org/10.3103/S8756699019050054
Final published version

M. F. Stupak
N. N. Mikhailov
S. A. Dvoretsky
M. V. Yakushev

Original language	English
Pages (from-to)	447-454
Number of pages	8
Journal	Optoelectronics, Instrumentation and Data Processing
Volume	55
Issue number	5
DOIs	https://doi.org/10.3103/S8756699019050054
Publication status	Published - 1 Sept 2019

OECD FOS+WOS

Research areas

$\bar 43m$ crystals, azimuthal angular dependences, CdHgTe structures, GaAs substrates, second harmonic, (4)over-bar3m crystals, CdxHg1-xTe structures

ID: 23259240