Research output: Contribution to journal › Article › peer-review
Errors of Estimating the Parameters of Local Magnetic Anomalies Based on Magnetic Survey Performed at Different Altitudes by an Unmanned Aerial Vehicle. / Kosykh, V. P.; Gromilin, G. I.; Firsov, A. P. et al.
In: Optoelectronics, Instrumentation and Data Processing, Vol. 54, No. 4, 01.07.2018, p. 328-333.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Errors of Estimating the Parameters of Local Magnetic Anomalies Based on Magnetic Survey Performed at Different Altitudes by an Unmanned Aerial Vehicle
AU - Kosykh, V. P.
AU - Gromilin, G. I.
AU - Firsov, A. P.
AU - Savluk, A. V.
N1 - Publisher Copyright: © 2018, Allerton Press, Inc.
PY - 2018/7/1
Y1 - 2018/7/1
N2 - The errors of estimates of the size, depth, and magnetization of a local source of a simply shaped magnetic anomaly are studied by means of a comprehensive analysis of magnetic survey performed at different altitudes. Numerical simulations show that the values of magnetic induction induced by the presence of a magnetic source measured at different altitudes provide a more accurate estimate of some parameters of this source than the measurements performed at one altitude.
AB - The errors of estimates of the size, depth, and magnetization of a local source of a simply shaped magnetic anomaly are studied by means of a comprehensive analysis of magnetic survey performed at different altitudes. Numerical simulations show that the values of magnetic induction induced by the presence of a magnetic source measured at different altitudes provide a more accurate estimate of some parameters of this source than the measurements performed at one altitude.
KW - inverse problems of magnetic survey
KW - magnetic anomaly
KW - UAV
UR - http://www.scopus.com/inward/record.url?scp=85053937117&partnerID=8YFLogxK
U2 - 10.3103/S8756699018040027
DO - 10.3103/S8756699018040027
M3 - Article
AN - SCOPUS:85053937117
VL - 54
SP - 328
EP - 333
JO - Optoelectronics, Instrumentation and Data Processing
JF - Optoelectronics, Instrumentation and Data Processing
SN - 8756-6990
IS - 4
ER -
ID: 16758062