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Embedding of iron silicide nanocrystals into monocrystalline silicon: Suppression of emersion effect

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Nano-Superconduction Laboratory

DOI

https://doi.org/10.1117/12.2314675
Final published version

Evgeniy Chusovitin
Dmitry Goroshko
Sergey Dotsenko
Alexander Shevlyagin
Anton Gutakovskii
Nikolay Galkin

Original language	English
Title of host publication	Asia-Pacific Conference on Fundamental Problems of Opto- and Microelectronics 2017
Editors	Yuri N. Kulchin, Roman V. Romashko, Jyh-Chiang Jiang
Publisher	SPIE
Number of pages	8
Volume	11024
ISBN (Electronic)	9781510627147
DOIs	https://doi.org/10.1117/12.2314675
Publication status	Published - 1 Jan 2019
Event	16th Asia-Pacific Conference on Fundamental Problems of Opto- and Microelectronics, APCOM 2017 - Taipei, Taiwan, Province of China Duration: 5 Nov 2017 → 7 Nov 2017

Publication series

Name	Proceedings of SPIE
Publisher	SPIE-INT SOC OPTICAL ENGINEERING
Volume	11024
ISSN (Print)	0277-786X

Conference

Conference	16th Asia-Pacific Conference on Fundamental Problems of Opto- and Microelectronics, APCOM 2017
Country/Territory	Taiwan, Province of China
City	Taipei
Period	05.11.2017 → 07.11.2017

Research areas

embedded nanocrystals, epitaxy, phase transformation, silicon, β-FeSi, TRANSITION, TEMPERATURE, beta-FeSi2, FESI2, GAAS, SOLID-PHASE EPITAXY, QUANTUM DOTS

ID: 18489709