• A. A. Lavrentyev
  • B. V. Gabrelian
  • V. T. Vu
  • L. N. Ananchenko
  • L. I. Isaenko
  • A. P. Yelisseyev
  • O. Y. Khyzhun
Original languageEnglish
Pages (from-to)149-159
Number of pages11
JournalOptical Materials
Volume66
DOIs
Publication statusPublished - 1 Apr 2017

    Research areas

  • Electronic structure, Optical properties, Semiconductors, X-ray emission spectroscopy, X-ray photoelectron spectroscopy, TEMPERATURE-DEPENDENCE, SUSCEPTIBILITIES, MID-IR, LIGAX2 X, CHALCOGENIDES, SINGLE-CRYSTAL, SE, RAY SPECTROSCOPY MEASUREMENTS, 1ST-PRINCIPLES, GROWTH

    OECD FOS+WOS

ID: 10036817