Elastic Properties of Suspended Conducting GaAs/AlGaAs Nanostructures by Means of Atomic Force Microscopy

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	496-501
Number of pages	6
Journal	Optoelectronics, Instrumentation and Data Processing
Volume	54
Issue number	5
DOIs	https://doi.org/10.3103/S8756699018050114
Publication status	Published - 1 Sept 2018

atomic-force microscopy, GaAs/AlGaAs, nanoelectromechanical systems, suspended nanostructures

ID: 17669443