Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
Device for reliable localization of skin surface active zones in inert gases environment. / Fateev, Aleksandr M.; Marauskas, Vyacheslav V.; Lisitsyna, Liliya I. et al.
2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2020. IEEE Computer Society, 2020. p. 454-457 9153530 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM; Vol. 2020-June).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
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TY - GEN
T1 - Device for reliable localization of skin surface active zones in inert gases environment
AU - Fateev, Aleksandr M.
AU - Marauskas, Vyacheslav V.
AU - Lisitsyna, Liliya I.
AU - Navrotsky, Leonid G.
AU - Yudin, Valerii I.
PY - 2020/6/1
Y1 - 2020/6/1
N2 - The method and device, enhancing the reliability of skin surface active zones localization in argon environment by photo registration from three positions using high frequency high voltage pulses in real time regime, are developed. Device design and functional diagram, electric pulses parameters ranges are considered, working gas choice is reasoned.
AB - The method and device, enhancing the reliability of skin surface active zones localization in argon environment by photo registration from three positions using high frequency high voltage pulses in real time regime, are developed. Device design and functional diagram, electric pulses parameters ranges are considered, working gas choice is reasoned.
KW - Biologically active zones
KW - Discharge
KW - High frequency high voltage pulses
KW - Skin surface
KW - Visualization
UR - http://www.scopus.com/inward/record.url?scp=85090856116&partnerID=8YFLogxK
U2 - 10.1109/EDM49804.2020.9153530
DO - 10.1109/EDM49804.2020.9153530
M3 - Conference contribution
AN - SCOPUS:85090856116
T3 - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM
SP - 454
EP - 457
BT - 2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2020
PB - IEEE Computer Society
T2 - 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2020
Y2 - 29 June 2020 through 3 July 2020
ER -
ID: 25309524