Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
Depression Detection Through EEG Signal Analysis: A Convolutional Autoencoder Deep Learning Model. / Firoz, Neda; Aksyonov, Sergey Vladimirovich; Berestneva, Olga Grigorievna et al.
International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, 2025. p. 1820-1825 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
}
TY - GEN
T1 - Depression Detection Through EEG Signal Analysis: A Convolutional Autoencoder Deep Learning Model
AU - Firoz, Neda
AU - Aksyonov, Sergey Vladimirovich
AU - Berestneva, Olga Grigorievna
AU - Savostyanov, Alexander
N1 - Conference code: 26
PY - 2025/8/8
Y1 - 2025/8/8
N2 - Depression is a debilitating and enervating mental health disorder that requires attention for necessitating accurate and efficient diagnostic techniques. Developments in deep learning and neurophysiological data analysis have enabled the use of EEG signals for binary depression classification. In this study, a novel approach is introduced that utilizes Convolutional Autoencoders for feature extraction from EEG signals, to enhance feature representation for classification of depression. To our knowledge, this is the first study utilizing the ICBrainDB dataset, which includes EEG test results and psychological questionnaire responses from over 1,000 participants across various regions of Russia. A series of experiments were carried out to evaluate the classification performance of both traditional machine learning and deep learning approaches in predicting depression using this novel dataset. The findings demonstrate that incorporating EEG feature sets extracted through CAE encodings significantly enhances classification accuracy. Specifically, the Random Forest and CNN models achieved impressive classification accuracies of 98.31% and 99.31%, respectively, in distinguishing individuals with depression from healthy controls. This study contributes to the expanding field of computational psychiatry by introducing a robust, data-driven framework for depression prediction, fostering the development of more reliable and automated mental health assessments.
AB - Depression is a debilitating and enervating mental health disorder that requires attention for necessitating accurate and efficient diagnostic techniques. Developments in deep learning and neurophysiological data analysis have enabled the use of EEG signals for binary depression classification. In this study, a novel approach is introduced that utilizes Convolutional Autoencoders for feature extraction from EEG signals, to enhance feature representation for classification of depression. To our knowledge, this is the first study utilizing the ICBrainDB dataset, which includes EEG test results and psychological questionnaire responses from over 1,000 participants across various regions of Russia. A series of experiments were carried out to evaluate the classification performance of both traditional machine learning and deep learning approaches in predicting depression using this novel dataset. The findings demonstrate that incorporating EEG feature sets extracted through CAE encodings significantly enhances classification accuracy. Specifically, the Random Forest and CNN models achieved impressive classification accuracies of 98.31% and 99.31%, respectively, in distinguishing individuals with depression from healthy controls. This study contributes to the expanding field of computational psychiatry by introducing a robust, data-driven framework for depression prediction, fostering the development of more reliable and automated mental health assessments.
KW - Convolutional Autoencoders
KW - Deep learning
KW - Depression
KW - EEG signals
KW - ICBrainDB
KW - Machine learning
UR - https://www.scopus.com/pages/publications/105014193983
UR - https://www.mendeley.com/catalogue/0725e6e9-7ea0-3c31-90ef-b7974486417e/
U2 - 10.1109/EDM65517.2025.11096865
DO - 10.1109/EDM65517.2025.11096865
M3 - Conference contribution
SN - 9781665477376
T3 - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM
SP - 1820
EP - 1825
BT - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM
PB - IEEE Computer Society
T2 - 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM)
Y2 - 27 June 2025 through 1 July 2025
ER -
ID: 68949646