Original languageEnglish
Pages (from-to)18-23
Number of pages6
JournalMaterials Science in Semiconductor Processing
Volume57
DOIs
Publication statusPublished - 1 Jan 2017

    OECD FOS+WOS

    Research areas

  • Dynamic equilibrium, Ge MBE on Si(100), High-temperature growth, Self-organization, Strain relaxation, 001 SURFACE, SILICON, SI(001), SI(111), MICROSCOPY, GE/SI(100) ISLANDS, QUANTUM DOTS, LAYERS, GERMANIUM, GROWTH

ID: 10351826