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Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier. / Petrov, V. V.; Kuptsov, G. V.; Nozdrina, A. I. et al.

In: Quantum Electronics, Vol. 49, No. 4, 01.01.2019, p. 358-361.

Research output: Contribution to journalArticlepeer-review

Harvard

Petrov, VV, Kuptsov, GV, Nozdrina, AI, Petrov, VA, Laptev, AV, Kirpichnikov, AV & Pestryakov, EV 2019, 'Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier', Quantum Electronics, vol. 49, no. 4, pp. 358-361. https://doi.org/10.1070/QEL16972

APA

Petrov, V. V., Kuptsov, G. V., Nozdrina, A. I., Petrov, V. A., Laptev, A. V., Kirpichnikov, A. V., & Pestryakov, E. V. (2019). Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier. Quantum Electronics, 49(4), 358-361. https://doi.org/10.1070/QEL16972

Vancouver

Petrov VV, Kuptsov GV, Nozdrina AI, Petrov VA, Laptev AV, Kirpichnikov AV et al. Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier. Quantum Electronics. 2019 Jan 1;49(4):358-361. doi: 10.1070/QEL16972

Author

Petrov, V. V. ; Kuptsov, G. V. ; Nozdrina, A. I. et al. / Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier. In: Quantum Electronics. 2019 ; Vol. 49, No. 4. pp. 358-361.

BibTeX

@article{24d5ba8a5bf047c0bc58c2cdb3cb1401,
title = "Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier",
abstract = "A new original method has been developed and experimentally implemented, allowing temperature fields to be contactlessly measured in the pump region of active elements in high-power-diode-pumped laser amplifiers, including those operating at cryogenic temperatures. The presence of a temperature gradient of ∼57 K mm-1 along the pump beam axis at the centre of the active element of the laser amplification unit operating at cryogenic temperatures with a pulse repetition rate up to 1 kHz is simulated and experimentally confirmed.",
keywords = "cryogenic temperatures, diode pumping, high pulse repetition rate, laser amplifier, laser thermometry, AVERAGE-POWER, LASER CRYSTALS",
author = "Petrov, {V. V.} and Kuptsov, {G. V.} and Nozdrina, {A. I.} and Petrov, {V. A.} and Laptev, {A. V.} and Kirpichnikov, {A. V.} and Pestryakov, {E. V.}",
year = "2019",
month = jan,
day = "1",
doi = "10.1070/QEL16972",
language = "English",
volume = "49",
pages = "358--361",
journal = "Quantum Electronics",
issn = "1063-7818",
publisher = "Turpion Ltd.",
number = "4",

}

RIS

TY - JOUR

T1 - Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier

AU - Petrov, V. V.

AU - Kuptsov, G. V.

AU - Nozdrina, A. I.

AU - Petrov, V. A.

AU - Laptev, A. V.

AU - Kirpichnikov, A. V.

AU - Pestryakov, E. V.

PY - 2019/1/1

Y1 - 2019/1/1

N2 - A new original method has been developed and experimentally implemented, allowing temperature fields to be contactlessly measured in the pump region of active elements in high-power-diode-pumped laser amplifiers, including those operating at cryogenic temperatures. The presence of a temperature gradient of ∼57 K mm-1 along the pump beam axis at the centre of the active element of the laser amplification unit operating at cryogenic temperatures with a pulse repetition rate up to 1 kHz is simulated and experimentally confirmed.

AB - A new original method has been developed and experimentally implemented, allowing temperature fields to be contactlessly measured in the pump region of active elements in high-power-diode-pumped laser amplifiers, including those operating at cryogenic temperatures. The presence of a temperature gradient of ∼57 K mm-1 along the pump beam axis at the centre of the active element of the laser amplification unit operating at cryogenic temperatures with a pulse repetition rate up to 1 kHz is simulated and experimentally confirmed.

KW - cryogenic temperatures

KW - diode pumping

KW - high pulse repetition rate

KW - laser amplifier

KW - laser thermometry

KW - AVERAGE-POWER

KW - LASER CRYSTALS

UR - http://www.scopus.com/inward/record.url?scp=85066282901&partnerID=8YFLogxK

U2 - 10.1070/QEL16972

DO - 10.1070/QEL16972

M3 - Article

AN - SCOPUS:85066282901

VL - 49

SP - 358

EP - 361

JO - Quantum Electronics

JF - Quantum Electronics

SN - 1063-7818

IS - 4

ER -

ID: 20347630