DOI

  • Vladimir A. Gritsenko
  • Timofey V. Perevalov
  • Vitalii A. Voronkovskii
  • Andrei A. Gismatulin
  • Vladimir N. Kruchinin
  • Vladimir Sh Aliev
  • Vladimir A. Pustovarov
  • Igor P. Prosvirin
  • Yakov Roizin
Original languageEnglish
Pages (from-to)3769-3775
Number of pages7
JournalACS Applied Materials and Interfaces
Volume10
Issue number4
DOIs
Publication statusPublished - 31 Jan 2018

    OECD FOS+WOS

    Research areas

  • ab initio simulation, charge transport, optic, oxygen vacancy, photoluminescence, Traps, XPS

ID: 10452741