Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
Button Press Detection from EEG Signals Using Deep Learning. / Kuzucu, Enes E.
Proceedings of the 2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials, EDM 2022. IEEE Computer Society, 2022. p. 538-542 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM; Vol. 2022-June).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
}
TY - GEN
T1 - Button Press Detection from EEG Signals Using Deep Learning
AU - Kuzucu, Enes E.
N1 - Funding Information: ACKNOWLEDGMENT Financial support: The EEG data collection was supported by grant № 22-15-00142 of Russian Science Foundation. Publisher Copyright: © 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - Electroencephalogram (EEG) signals are mainly used for neuroscience studies and for brain-computer interface applications with a rising trend. Majority of studies include conducting experiments with different paradigms, and studying the results of experiments for scientific discoveries or various practical applications. It is likely that in the near future, all EEG related scientific discoveries will combine into one comprehensive automated EEG analysis framework where different paradigms can be analyzed in terms of detection of events, markers and signals of interest. In this study we created an application which estimates time of button press actions from stop-signal paradigm EEG recordings, using deep learning methods. Current results indicate that the proposed solution has low intra-subject and inter-subject variability and the work can be further investigated with different applications as well as different paradigms. We are hoping that this work will be the first step to a complete paradigm analysis framework, which aims to automatically extract experiment related information from single-trial EEG signals and facilitates the overall research and analysis process as well being used as a part of various brain-computer interface applications.
AB - Electroencephalogram (EEG) signals are mainly used for neuroscience studies and for brain-computer interface applications with a rising trend. Majority of studies include conducting experiments with different paradigms, and studying the results of experiments for scientific discoveries or various practical applications. It is likely that in the near future, all EEG related scientific discoveries will combine into one comprehensive automated EEG analysis framework where different paradigms can be analyzed in terms of detection of events, markers and signals of interest. In this study we created an application which estimates time of button press actions from stop-signal paradigm EEG recordings, using deep learning methods. Current results indicate that the proposed solution has low intra-subject and inter-subject variability and the work can be further investigated with different applications as well as different paradigms. We are hoping that this work will be the first step to a complete paradigm analysis framework, which aims to automatically extract experiment related information from single-trial EEG signals and facilitates the overall research and analysis process as well being used as a part of various brain-computer interface applications.
KW - button press detection
KW - convolutional neural networks
KW - deep learning
KW - EEG
KW - stop-signal
UR - http://www.scopus.com/inward/record.url?scp=85137320878&partnerID=8YFLogxK
UR - https://www.mendeley.com/catalogue/798eb59a-3ae7-3f61-a9b6-36a150b8b3db/
U2 - 10.1109/EDM55285.2022.9855191
DO - 10.1109/EDM55285.2022.9855191
M3 - Conference contribution
AN - SCOPUS:85137320878
SN - 9781665498043
T3 - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM
SP - 538
EP - 542
BT - Proceedings of the 2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials, EDM 2022
PB - IEEE Computer Society
T2 - 23rd IEEE International Conference of Young Professionals in Electron Devices and Materials, EDM 2022
Y2 - 30 June 2022 through 4 July 2022
ER -
ID: 37142094