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Approaches to the study of the evanescent field of terahertz surface plasmon polaritons at the Novosibirsk free electron laser. / Kukotenko, Valeriia D.; Gerasimov, Vasily V.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 12776, 1277607, 2023.

Research output: Contribution to journalConference articlepeer-review

Harvard

Kukotenko, VD & Gerasimov, VV 2023, 'Approaches to the study of the evanescent field of terahertz surface plasmon polaritons at the Novosibirsk free electron laser', Proceedings of SPIE - The International Society for Optical Engineering, vol. 12776, 1277607. https://doi.org/10.1117/12.2687472

APA

Vancouver

Kukotenko VD, Gerasimov VV. Approaches to the study of the evanescent field of terahertz surface plasmon polaritons at the Novosibirsk free electron laser. Proceedings of SPIE - The International Society for Optical Engineering. 2023;12776:1277607. doi: 10.1117/12.2687472

Author

Kukotenko, Valeriia D. ; Gerasimov, Vasily V. / Approaches to the study of the evanescent field of terahertz surface plasmon polaritons at the Novosibirsk free electron laser. In: Proceedings of SPIE - The International Society for Optical Engineering. 2023 ; Vol. 12776.

BibTeX

@article{0da3017b64224e47a1b0508c3a0a7230,
title = "Approaches to the study of the evanescent field of terahertz surface plasmon polaritons at the Novosibirsk free electron laser",
abstract = "Currently, in photonic integrated circuits, the circuit size is limited by diffraction, which acts as a barrier to further development in the field of optical communications. Plasmonics could potentially address this size mismatch between electronic and photonic components. Photonics and plasmonics can complement each other, given the appropriate conditions, allowing optical signals to be converted into surface plasmon-polaritons (SPPs) and vice versa. Therefore, plasmonic integrated planar circuits for wireless communication devices are actively being developed. Transitioning to the terahertz (THz) frequency range will enhance data transmission and processing speed. In the development of plasmonic integrated circuits, understanding the optical properties of surfaces is crucial. Current methods for determining the optical properties of surfaces in the THz frequency range lack sufficient sensitivity to transitional surface layers of metal and films that are much thinner than the optical wavelength. This work will demonstrate experimental methods for measuring the penetration depth of the SPP field into the air. Through these methods, and utilizing other plasmonic refractometric characteristics, it is possible to reconstruct the effective surface dielectric permittivity of the metal.",
author = "Kukotenko, {Valeriia D.} and Gerasimov, {Vasily V.}",
note = "The work was done at the shared research center «Siberian Center for Synchrotron and Terahertz Radiation» on the basis of the Novosibirsk FEL at the Institute of Nuclear Physics SB RAS.; Infrared, Millimeter-Wave, and Terahertz Technologies X 2023 ; Conference date: 15-10-2023 Through 16-10-2023",
year = "2023",
doi = "10.1117/12.2687472",
language = "English",
volume = "12776",
journal = "Proceedings of SPIE - The International Society for Optical Engineering",
issn = "0277-786X",
publisher = "SPIE",

}

RIS

TY - JOUR

T1 - Approaches to the study of the evanescent field of terahertz surface plasmon polaritons at the Novosibirsk free electron laser

AU - Kukotenko, Valeriia D.

AU - Gerasimov, Vasily V.

N1 - Conference code: 10

PY - 2023

Y1 - 2023

N2 - Currently, in photonic integrated circuits, the circuit size is limited by diffraction, which acts as a barrier to further development in the field of optical communications. Plasmonics could potentially address this size mismatch between electronic and photonic components. Photonics and plasmonics can complement each other, given the appropriate conditions, allowing optical signals to be converted into surface plasmon-polaritons (SPPs) and vice versa. Therefore, plasmonic integrated planar circuits for wireless communication devices are actively being developed. Transitioning to the terahertz (THz) frequency range will enhance data transmission and processing speed. In the development of plasmonic integrated circuits, understanding the optical properties of surfaces is crucial. Current methods for determining the optical properties of surfaces in the THz frequency range lack sufficient sensitivity to transitional surface layers of metal and films that are much thinner than the optical wavelength. This work will demonstrate experimental methods for measuring the penetration depth of the SPP field into the air. Through these methods, and utilizing other plasmonic refractometric characteristics, it is possible to reconstruct the effective surface dielectric permittivity of the metal.

AB - Currently, in photonic integrated circuits, the circuit size is limited by diffraction, which acts as a barrier to further development in the field of optical communications. Plasmonics could potentially address this size mismatch between electronic and photonic components. Photonics and plasmonics can complement each other, given the appropriate conditions, allowing optical signals to be converted into surface plasmon-polaritons (SPPs) and vice versa. Therefore, plasmonic integrated planar circuits for wireless communication devices are actively being developed. Transitioning to the terahertz (THz) frequency range will enhance data transmission and processing speed. In the development of plasmonic integrated circuits, understanding the optical properties of surfaces is crucial. Current methods for determining the optical properties of surfaces in the THz frequency range lack sufficient sensitivity to transitional surface layers of metal and films that are much thinner than the optical wavelength. This work will demonstrate experimental methods for measuring the penetration depth of the SPP field into the air. Through these methods, and utilizing other plasmonic refractometric characteristics, it is possible to reconstruct the effective surface dielectric permittivity of the metal.

UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85180152990&origin=inward&txGid=4f58cc1f7fb7c6a0413a0dc7162556bc

UR - https://www.mendeley.com/catalogue/f3bfe999-12ff-3583-b0e3-fd64fca1dbee/

U2 - 10.1117/12.2687472

DO - 10.1117/12.2687472

M3 - Conference article

VL - 12776

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

M1 - 1277607

T2 - Infrared, Millimeter-Wave, and Terahertz Technologies X 2023

Y2 - 15 October 2023 through 16 October 2023

ER -

ID: 59460874