Research output: Contribution to journal › Article › peer-review
Application of LIGA Rasters for the Filtration of Scattered Radiation in Dental Radiography. / Nazmov, V. P.; Sheplev, B. V.; Palchikov, E. I. et al.
In: Journal of Surface Investigation, Vol. 17, No. Suppl 1, 12.2023, p. S265-S270.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Application of LIGA Rasters for the Filtration of Scattered Radiation in Dental Radiography
AU - Nazmov, V. P.
AU - Sheplev, B. V.
AU - Palchikov, E. I.
AU - Dolgikh, A. V.
AU - Samoylenko, M. S.
AU - Saloshenko, T. V.
N1 - Equipment of the Siberian Center for Synchrotron and Terahertz Radiation (SCSTR) was used in this work. The study of the process of microstructuring rasters using X-ray lithography was carried out within the framework of an agreement with the Ministry of Science and Higher Education of the Russian Federation no. 075-15-2021-1359. The visiographic equipment (SIRONA emitter and detector, as well as anonymized samples) were presented by OOO Dental-Service and OOO ARTA. Публикация для корректировки.
PY - 2023/12
Y1 - 2023/12
N2 - An experimental study of the suppression of noise in the image of a dental visiograph, caused by scattered radiation in the X-ray range of the spectrum, is carried out. To suppress noise, a nickel raster fabricated using deep X-ray lithography is used. Placing the raster directly in front of the detector makes it possible to suppress the background caused by scattered radiation and increase the signal-to-noise ratio both in areas with low optical density and in areas with high optical density.
AB - An experimental study of the suppression of noise in the image of a dental visiograph, caused by scattered radiation in the X-ray range of the spectrum, is carried out. To suppress noise, a nickel raster fabricated using deep X-ray lithography is used. Placing the raster directly in front of the detector makes it possible to suppress the background caused by scattered radiation and increase the signal-to-noise ratio both in areas with low optical density and in areas with high optical density.
KW - X-ray microscopy
KW - image
KW - raster
UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85186763716&origin=inward&txGid=f202896d1a6e225e742a6da725aa9412
UR - https://www.mendeley.com/catalogue/2e1da9a3-5ac8-3822-9bb7-7958ce996784/
U2 - 10.1134/S1027451023070388
DO - 10.1134/S1027451023070388
M3 - Article
VL - 17
SP - S265-S270
JO - Journal of Surface Investigation
JF - Journal of Surface Investigation
SN - 1027-4510
IS - Suppl 1
ER -
ID: 59754970