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Analysis and Imaging of Internal Inhomogeneities in Transparent Optical Materials by Three-Dimensional Laser Heterodyne Microprobing. / Steinberg, I. Sh; Tverdokhleb, P. E.; Belikov, A. Yu.

In: Optoelectronics, Instrumentation and Data Processing, Vol. 54, No. 6, 01.11.2018, p. 546-556.

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Steinberg IS, Tverdokhleb PE, Belikov AY. Analysis and Imaging of Internal Inhomogeneities in Transparent Optical Materials by Three-Dimensional Laser Heterodyne Microprobing. Optoelectronics, Instrumentation and Data Processing. 2018 Nov 1;54(6):546-556. doi: 10.3103/S8756699018060031

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Steinberg, I. Sh ; Tverdokhleb, P. E. ; Belikov, A. Yu. / Analysis and Imaging of Internal Inhomogeneities in Transparent Optical Materials by Three-Dimensional Laser Heterodyne Microprobing. In: Optoelectronics, Instrumentation and Data Processing. 2018 ; Vol. 54, No. 6. pp. 546-556.

BibTeX

@article{77120aacb3244128a1bf89a7fd0511de,
title = "Analysis and Imaging of Internal Inhomogeneities in Transparent Optical Materials by Three-Dimensional Laser Heterodyne Microprobing",
abstract = "A method for studying internal phase inhomogeneities in transparent optical materials by point-to-point three-dimensional laser heterodyne microprobing is proposed. The light microprobe in this case is a traveling micrograting formed in the zone of overlapping of two focused coherent light beams: reference and signal. The size of the microprobe in the x, y, z directions and the degree of influence of spherical aberration with a change in the microprobing depth are estimated. The capabilities of the method are illustrated by examples of detection and subsequent imaging of phase inhomogeneities in the volume of laser ceramics and its random layers.",
keywords = "laser heterodyne microprobing, optical materials, phase microinhomogeneity",
author = "Steinberg, {I. Sh} and Tverdokhleb, {P. E.} and Belikov, {A. Yu}",
year = "2018",
month = nov,
day = "1",
doi = "10.3103/S8756699018060031",
language = "English",
volume = "54",
pages = "546--556",
journal = "Optoelectronics, Instrumentation and Data Processing",
issn = "8756-6990",
publisher = "Allerton Press Inc.",
number = "6",

}

RIS

TY - JOUR

T1 - Analysis and Imaging of Internal Inhomogeneities in Transparent Optical Materials by Three-Dimensional Laser Heterodyne Microprobing

AU - Steinberg, I. Sh

AU - Tverdokhleb, P. E.

AU - Belikov, A. Yu

PY - 2018/11/1

Y1 - 2018/11/1

N2 - A method for studying internal phase inhomogeneities in transparent optical materials by point-to-point three-dimensional laser heterodyne microprobing is proposed. The light microprobe in this case is a traveling micrograting formed in the zone of overlapping of two focused coherent light beams: reference and signal. The size of the microprobe in the x, y, z directions and the degree of influence of spherical aberration with a change in the microprobing depth are estimated. The capabilities of the method are illustrated by examples of detection and subsequent imaging of phase inhomogeneities in the volume of laser ceramics and its random layers.

AB - A method for studying internal phase inhomogeneities in transparent optical materials by point-to-point three-dimensional laser heterodyne microprobing is proposed. The light microprobe in this case is a traveling micrograting formed in the zone of overlapping of two focused coherent light beams: reference and signal. The size of the microprobe in the x, y, z directions and the degree of influence of spherical aberration with a change in the microprobing depth are estimated. The capabilities of the method are illustrated by examples of detection and subsequent imaging of phase inhomogeneities in the volume of laser ceramics and its random layers.

KW - laser heterodyne microprobing

KW - optical materials

KW - phase microinhomogeneity

UR - http://www.scopus.com/inward/record.url?scp=85060781419&partnerID=8YFLogxK

U2 - 10.3103/S8756699018060031

DO - 10.3103/S8756699018060031

M3 - Article

AN - SCOPUS:85060781419

VL - 54

SP - 546

EP - 556

JO - Optoelectronics, Instrumentation and Data Processing

JF - Optoelectronics, Instrumentation and Data Processing

SN - 8756-6990

IS - 6

ER -

ID: 18907213