Original languageEnglish
Pages (from-to)196-201
Number of pages6
JournalJournal of Crystal Growth
Volume457
DOIs
Publication statusPublished - 1 Jan 2017

    Research areas

  • A1. Diffusion, A1. Mass transfer, A1. Surface processes, B2. Semiconducting silicon, VICINAL SURFACES, SILICON, SUBLIMATION, REFLECTION ELECTRON-MICROSCOPY, Mass transfer, TEMPERATURE, PHASE-TRANSITION, GROWTH, Semiconducting silicon, SCANNING-TUNNELING-MICROSCOPY, Surface processes, Diffusion, IN-SITU, TRANSFORMATIONS

    OECD FOS+WOS

ID: 10352102