A Thin Layer Method for the LA-ICP-MS Analysis of Trace Element Concentrates

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	316-323
Number of pages	8
Journal	Journal of Analytical Chemistry
Volume	78
Issue number	3
DOIs	https://doi.org/10.1134/S1061934823030097
Publication status	Published - Mar 2023

high-purity substances, inductively coupled plasma, laser ablation, mass spectrometry, preconcentration of trace element, thin layer method

ID: 59654993