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A Technique for Detecting Subpicosecond Reflection or Transmission Kinetics. / Borisov, G. M.; Gol’dort, V. G.; Kovalyov, A. A. et al.

In: Instruments and Experimental Techniques, Vol. 61, No. 1, 01.01.2018, p. 94-98.

Research output: Contribution to journal › Article › peer-review

Harvard

Borisov, GM, Gol’dort, VG, Kovalyov, AA, Ledovskikh, DV & Rubtsova, NN 2018, 'A Technique for Detecting Subpicosecond Reflection or Transmission Kinetics', Instruments and Experimental Techniques, vol. 61, no. 1, pp. 94-98. https://doi.org/10.1134/S0020441218010025

APA

Borisov, G. M., Gol’dort, V. G., Kovalyov, A. A., Ledovskikh, D. V., & Rubtsova, N. N. (2018). A Technique for Detecting Subpicosecond Reflection or Transmission Kinetics. Instruments and Experimental Techniques, 61(1), 94-98. https://doi.org/10.1134/S0020441218010025

Vancouver

Borisov GM, Gol’dort VG, Kovalyov AA, Ledovskikh DV, Rubtsova NN. A Technique for Detecting Subpicosecond Reflection or Transmission Kinetics. Instruments and Experimental Techniques. 2018 Jan 1;61(1):94-98. doi: 10.1134/S0020441218010025

Author

Borisov, G. M. ; Gol’dort, V. G. ; Kovalyov, A. A. et al. / A Technique for Detecting Subpicosecond Reflection or Transmission Kinetics. In: Instruments and Experimental Techniques. 2018 ; Vol. 61, No. 1. pp. 94-98.

BibTeX

@article{7916a89a23304cc1bfcd7170b4b846e3,
title = "A Technique for Detecting Subpicosecond Reflection or Transmission Kinetics",
abstract = "A double-modulation technique was developed and tested experimentally for the detection of the kinetics of reflection of subpicosecond pulses of probe near-IR radiation from a sample (or transmission through it) after the action of exciting radiation pulses. A probe signal is detected at a frequency that is equal to the sum of stabilized unequal frequencies of interrupting exciting and probe radiations, thus permitting the elimination of the contribution of scattered exciting radiation from the valid signal. When detecting the semiconductor- sample reflectance kinetics with a time resolution of 0.13 ps, the reflection sensitivity ΔR/R = 5 × 10–6was reached.",
keywords = "LASER",
author = "Borisov, {G. M.} and Gol{\textquoteright}dort, {V. G.} and Kovalyov, {A. A.} and Ledovskikh, {D. V.} and Rubtsova, {N. N.}",
year = "2018",
month = jan,
day = "1",
doi = "10.1134/S0020441218010025",
language = "English",
volume = "61",
pages = "94--98",
journal = "Instruments and Experimental Techniques",
issn = "0020-4412",
publisher = "Maik Nauka-Interperiodica Publishing",
number = "1",

}

RIS

TY - JOUR

T1 - A Technique for Detecting Subpicosecond Reflection or Transmission Kinetics

AU - Borisov, G. M.

AU - Gol’dort, V. G.

AU - Kovalyov, A. A.

AU - Ledovskikh, D. V.

AU - Rubtsova, N. N.

PY - 2018/1/1

Y1 - 2018/1/1

N2 - A double-modulation technique was developed and tested experimentally for the detection of the kinetics of reflection of subpicosecond pulses of probe near-IR radiation from a sample (or transmission through it) after the action of exciting radiation pulses. A probe signal is detected at a frequency that is equal to the sum of stabilized unequal frequencies of interrupting exciting and probe radiations, thus permitting the elimination of the contribution of scattered exciting radiation from the valid signal. When detecting the semiconductor- sample reflectance kinetics with a time resolution of 0.13 ps, the reflection sensitivity ΔR/R = 5 × 10–6was reached.

AB - A double-modulation technique was developed and tested experimentally for the detection of the kinetics of reflection of subpicosecond pulses of probe near-IR radiation from a sample (or transmission through it) after the action of exciting radiation pulses. A probe signal is detected at a frequency that is equal to the sum of stabilized unequal frequencies of interrupting exciting and probe radiations, thus permitting the elimination of the contribution of scattered exciting radiation from the valid signal. When detecting the semiconductor- sample reflectance kinetics with a time resolution of 0.13 ps, the reflection sensitivity ΔR/R = 5 × 10–6was reached.

KW - LASER

UR - http://www.scopus.com/inward/record.url?scp=85042909792&partnerID=8YFLogxK

U2 - 10.1134/S0020441218010025

DO - 10.1134/S0020441218010025

M3 - Article

AN - SCOPUS:85042909792

VL - 61

SP - 94

EP - 98

JO - Instruments and Experimental Techniques

JF - Instruments and Experimental Techniques

SN - 0020-4412

IS - 1

ER -

ID: 10453770