Research output: Contribution to journal › Article › peer-review
A mesh free floating random walk method for solving diffusion imaging problems. / Sabelfeld, Karl K.
In: Statistics and Probability Letters, Vol. 121, 01.02.2017, p. 6-11.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - A mesh free floating random walk method for solving diffusion imaging problems
AU - Sabelfeld, Karl K.
PY - 2017/2/1
Y1 - 2017/2/1
N2 - We suggest a new mesh free random walk method for solving boundary value problems in semi-infinite domains with mixed boundary conditions. The method is based on a probabilistic interpretation of the diffusion processes. Our simulations show that the suggested algorithm is extremely efficient for solving diffusion imaging problems, in particular, for calculating the defect contrast in cathodoluminescence (CL) and electron beam-induced current (EBIC) techniques. The method avoids to simulate the long diffusion trajectories. Instead, it exploits exact probability distributions of the first passage and survival probabilities.
AB - We suggest a new mesh free random walk method for solving boundary value problems in semi-infinite domains with mixed boundary conditions. The method is based on a probabilistic interpretation of the diffusion processes. Our simulations show that the suggested algorithm is extremely efficient for solving diffusion imaging problems, in particular, for calculating the defect contrast in cathodoluminescence (CL) and electron beam-induced current (EBIC) techniques. The method avoids to simulate the long diffusion trajectories. Instead, it exploits exact probability distributions of the first passage and survival probabilities.
KW - Cathodoluminescence
KW - EBIC imaging
KW - Green's function
KW - Random walk
KW - Survival probability
KW - DISLOCATIONS
UR - http://www.scopus.com/inward/record.url?scp=84994236131&partnerID=8YFLogxK
U2 - 10.1016/j.spl.2016.10.006
DO - 10.1016/j.spl.2016.10.006
M3 - Article
AN - SCOPUS:84994236131
VL - 121
SP - 6
EP - 11
JO - Statistics and Probability Letters
JF - Statistics and Probability Letters
SN - 0167-7152
ER -
ID: 10320431