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2D imaging X-ray diagnostic for measuring the current density distribution in a wide-area electron beam produced in a multiaperture diode with plasma cathode. / Kurkuchekov, V.; Kandaurov, I.; Trunev, Y.

In: Journal of Instrumentation, Vol. 13, No. 5, 05003, 02.05.2018.

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Kurkuchekov V, Kandaurov I, Trunev Y. 2D imaging X-ray diagnostic for measuring the current density distribution in a wide-area electron beam produced in a multiaperture diode with plasma cathode. Journal of Instrumentation. 2018 May 2;13(5):05003. doi: 10.1088/1748-0221/13/05/P05003

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@article{59c2cdfd0f7f453fa16fab7beecee7e3,
title = "2D imaging X-ray diagnostic for measuring the current density distribution in a wide-area electron beam produced in a multiaperture diode with plasma cathode",
abstract = "A simple and inexpensive X-ray diagnostic tool was designed for measuring the cross-sectional current density distribution in a low-relativistic pulsed electron beam produced in a source based on an arc-discharge plasma cathode and multiaperture diode-type electron optical system. The beam parameters were as follows: Uacc = 50-110 kV, Ibeam = 20-100 A, τbeam = 0.1-0.3 ms. The beam effective diameter was ca. 7 cm. Based on a pinhole camera, the diagnostic allows one to obtain a 2D profile of electron beam flux distribution on a flat metal target in a single shot. The linearity of the diagnostic system response to the electron flux density was established experimentally. Spatial resolution of the diagnostic was also estimated in special test experiments. The optimal choice of the main components of the diagnostic technique is discussed.",
keywords = "Accelerator Applications, beam-intensity monitors, Beam-line instrumentation (beam position and profile monitors, bunch length monitors), FACILITY, beam-intensity monitors; bunch length monitors), FARADAY CUP ARRAY",
author = "V. Kurkuchekov and I. Kandaurov and Y. Trunev",
year = "2018",
month = may,
day = "2",
doi = "10.1088/1748-0221/13/05/P05003",
language = "English",
volume = "13",
journal = "Journal of Instrumentation",
issn = "1748-0221",
publisher = "IOP Publishing Ltd.",
number = "5",

}

RIS

TY - JOUR

T1 - 2D imaging X-ray diagnostic for measuring the current density distribution in a wide-area electron beam produced in a multiaperture diode with plasma cathode

AU - Kurkuchekov, V.

AU - Kandaurov, I.

AU - Trunev, Y.

PY - 2018/5/2

Y1 - 2018/5/2

N2 - A simple and inexpensive X-ray diagnostic tool was designed for measuring the cross-sectional current density distribution in a low-relativistic pulsed electron beam produced in a source based on an arc-discharge plasma cathode and multiaperture diode-type electron optical system. The beam parameters were as follows: Uacc = 50-110 kV, Ibeam = 20-100 A, τbeam = 0.1-0.3 ms. The beam effective diameter was ca. 7 cm. Based on a pinhole camera, the diagnostic allows one to obtain a 2D profile of electron beam flux distribution on a flat metal target in a single shot. The linearity of the diagnostic system response to the electron flux density was established experimentally. Spatial resolution of the diagnostic was also estimated in special test experiments. The optimal choice of the main components of the diagnostic technique is discussed.

AB - A simple and inexpensive X-ray diagnostic tool was designed for measuring the cross-sectional current density distribution in a low-relativistic pulsed electron beam produced in a source based on an arc-discharge plasma cathode and multiaperture diode-type electron optical system. The beam parameters were as follows: Uacc = 50-110 kV, Ibeam = 20-100 A, τbeam = 0.1-0.3 ms. The beam effective diameter was ca. 7 cm. Based on a pinhole camera, the diagnostic allows one to obtain a 2D profile of electron beam flux distribution on a flat metal target in a single shot. The linearity of the diagnostic system response to the electron flux density was established experimentally. Spatial resolution of the diagnostic was also estimated in special test experiments. The optimal choice of the main components of the diagnostic technique is discussed.

KW - Accelerator Applications

KW - beam-intensity monitors

KW - Beam-line instrumentation (beam position and profile monitors

KW - bunch length monitors)

KW - FACILITY

KW - beam-intensity monitors; bunch length monitors)

KW - FARADAY CUP ARRAY

UR - http://www.scopus.com/inward/record.url?scp=85048107929&partnerID=8YFLogxK

U2 - 10.1088/1748-0221/13/05/P05003

DO - 10.1088/1748-0221/13/05/P05003

M3 - Article

AN - SCOPUS:85048107929

VL - 13

JO - Journal of Instrumentation

JF - Journal of Instrumentation

SN - 1748-0221

IS - 5

M1 - 05003

ER -

ID: 13794044