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  1. Surface morphology analysis of CdTe buffer layers using ellipsometry and interference profilometry to create a technique for monitoring the growth of buffer layers

    Shvets, V. A., Marin, D. V., Kuznetsova, L. S., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., 20 Jul 2024, In: Journal of Optical Technology (A Translation of Opticheskii Zhurnal). 91, 2, p. 91-95 5 p., 6.

    Research output: Contribution to journal › Article › peer-review

  2. Temperature Dependence of the Spectra of Optical Constants of CdTe in the Region of the Absorption Edge

    Shvets, V. A., Marin, D. V., Yakushev, M. V. & Rykhiitskii, S. V., Apr 2024, In: Optics and Spectroscopy. 132, 4, p. 403-408 6 p.

    Research output: Contribution to journal › Article › peer-review

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ID: 3456539