Utilizing Lexicographic Resources for Sentiment Classification in Uzbek Language

Mengliev, D. B., Akhmedov, E. Y., Barakhnin, V. B., Hakimov, Z. A. & Alloyorov, O. M., 2023, Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023. Institute of Electrical and Electronics Engineers Inc., p. 1720-1724 5 p.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Using PCA Machine Learning Approach Based on Psychological Questionnaires and Spectral Characteristics of the EEG to Separate the Healthy Participants and Participants with Major Depressive Disorder

Merkulova, E. A., Kozulin, I. A., Savostyanov, A. N., Bocharov, A. V. & Privodnova, E. Y., 2023, 24th IEEE International Conference of Young Professionals in Electron Devices and Materials, EDM 2023; Novosibirsk; Russian Federation; 29 June 2023 до 3 July 2023. Institute of Electrical and Electronics Engineers Inc., p. 1740-1745 6 p.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Use of Computer Methods for Analyzing Brain Signals to Assess the Success of Adaptation of Labor Migrants to Extreme Climate Conditions

Milakhina, N., Karpova, A., Astakhova, T. & Savostyanov, A., 30 Jun 2021, 2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials, EDM 2021 - Proceedings. IEEE Computer Society, p. 577-581 5 p. 9507608. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM; vol. 2021-June).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Unsupervised Anomaly Detection on Distributed Log Tracing through Deep Learning

Khudyakov, D. A. & Yakhyaeva, G. E., 2024, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1830-1833 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Two-Step Deductive Verification of Control Software Using Reflex

Anureev, I., Garanina, N., Liakh, T., Rozov, A., Zyubin, V. & Gorlatch, S., 1 Jan 2019, Perspectives of System Informatics - 12th International Andrei P. Ershov Informatics Conference, PSI 2019, Revised Selected Papers. Bjørner, N., Virbitskaite, I. & Voronkov, A. (eds.). Springer International Publishing AG, p. 50-63 14 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 11964 LNCS).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Towards the Impact of Pruning Criteria and Tuning Approach on Model Interpretability and Quality

Shcherbin, A., 2024, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1800-1805 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Towards safe embedded systems: Industrialc translational semantics for avr microcontrollers^∗

Rozov, A., Anureev, I., Garanina, N., Liakh, T. & Zyubin, V., Oct 2019, SIBIRCON 2019 - International Multi-Conference on Engineering, Computer and Information Sciences, Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 857-861 5 p. 8958258. (SIBIRCON 2019 - International Multi-Conference on Engineering, Computer and Information Sciences, Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review