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  1. 2026

  2. Semantic modeling of subject domains using precedent and blurry (fuzzy) models

    Yakhyaeva, G., 8 Jan 2026, In: Journal of Mathematical Sciences (United States). 295, 1, 13 p.

    Research output: Contribution to journal › Article › peer-review

  3. Technological Means for Automatic Programs Construction in LuNA System

    Malyshkin, V., Perepelkin, V., Parfenov, D., Sinyukov, V., Spirin, V., Ivanchenko, D. & Nushtaev, Y., 2026, Parallel Computing Technologies. Malyshkin, V. (ed.). Springer, p. 105-123 19 p. 8. (Lecture Notes in Computer Science; vol. 16185).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  4. 2025

  5. Multi-Modal Fusion of EEG and Genetic Markers for Depression Prediction from ICBrainDB

    Firoz, N., Berestneva, O. G., Savostyanov, A. & Aksyonov, S. V., 18 Dec 2025, 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE). Institute of Electrical and Electronics Engineers Inc., p. 1-9 9 p.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  6. Программный фреймворк “Сигма”, версия 1.0.

    Болдырев, И. А., Сазонова, П. А., Лящук, Р. Н., Игнатенко, В. В., Брожинский, В. В., Дорошев, Н. А. & Шашкина, Е. П., 25 Nov 2025, Роспатент - Федеральная служба по интеллектуальной собственности, Patent No. 2025692937, 12 Nov 2025, Priority date 16 Nov 2025, Priority No. 2025691914

    Research output: Patent › Software registration

  7. An Intelligent Assistant for Working with Regulatory Documents Based on Ontological Modeling and RAG

    Grekhova, A., Palchunov, D., Shishkin, A. & Zaitsev, A., 18 Nov 2025, 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE). Institute of Electrical and Electronics Engineers Inc., p. 1-6 6 p.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  8. Automatic Recognition of Historical Documents of the Beginning of the 20th Century in Russian

    Barakhnin, V. & Gudkov, S., 18 Nov 2025, 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE). Institute of Electrical and Electronics Engineers Inc., p. 1-4 4 p.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  9. Integration of Logical and Neural Network Methods for Creation of Digital Twins of Regulations

    Palchunov, D., Nemtsev, I., Yakobson, A. & Shelkovnikova, S., 18 Nov 2025, 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE). Institute of Electrical and Electronics Engineers Inc., p. 1-6 6 p.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  10. Predicting Major Depressive Disorder Using Neural Networks from Spectral Measures of EEG Data

    Kozulin, I., Merkulova, E., Savostyanov, V., Shi, H., Wang, X., Bocharov, A. & Savostyanov, A., 16 Nov 2025, In: Bioengineering (Basel, Switzerland). 12, 11, 23 p., 1251.

    Research output: Contribution to journal › Article › peer-review

  11. Depression Detection Through EEG Signal Analysis: A Convolutional Autoencoder Deep Learning Model

    Firoz, N., Aksyonov, S. V., Berestneva, O. G. & Savostyanov, A., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1820-1825 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  12. Methods of Automatic Selection of Named Entities (NER) in Uzbek Language for Text Tone Analysis

    Saidov, B. R., Barakhnin, V. B., Rixsibayev, U. T., Sobirov, O. O., Bekchanov, K. M. & Sharipov, E. J., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1740-1745 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

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