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  1. 2025

  2. Development of a Comprehensive Methodology for Assessing Executive Control Measures and Its Validation on Groups of Russian and Foreign Students

    Zorina, K. A., Bodur, V. D., Tolstova, M. A. & Vergunov, E. G., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1800-1804 5 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  3. Development of a Microprocessor Quadrotor Control System

    Khodatovich, E. & Kotov, K., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1190-1195 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  4. Development of a Neurolinguistic Testing Technique to Identify Brain Self-Referential Processes

    Zlaia, S., Istomina, N., Stepanova, V., Savostyanov, V. & Tamozhnikov, S., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1840-1843 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  5. Development of a Personalized Recommendation System with High Data Protection

    Palchunova, O., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1830-1833 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  6. Jet Streams Upon Impact on Joints of Structural Materials

    Khalemenchuk, V., Artur, A., Rubtsov, I., Ten, K., Tumanik, A. & Kashkarov, A., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 630-634 5 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  7. Kinetic Study of Ge Nanocluster Formation in Composite GeOx[SiO2] Films

    Kislukhin, N. A., Astankova, K. N. & Volodin, V. A., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 120-124 5 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  8. Methods of Automatic Selection of Named Entities (NER) in Uzbek Language for Text Tone Analysis

    Saidov, B. R., Barakhnin, V. B., Rixsibayev, U. T., Sobirov, O. O., Bekchanov, K. M. & Sharipov, E. J., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1740-1745 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  9. Prediction of Anxiety Levels Based on Spatial-Frequency Patterns of EEG Activity During Perception of Another Person's Face

    Lozhnikov, V., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1850-1853 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  10. Semi-Automated Framework for Feature Engineering in Machine Learning and Data Analysis

    Radeev, N. & Vinogradova, K., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1520-1525 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  11. Structural Transformation of Bi2Se3(001) Surface during Sn Monolayer Annealing

    Zakhozhev, K., Ponomarev, S., Golyashov, V., Nasimov, D., Kokh, K. & Rogilo, D., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 80-83 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  12. Study of the influence of population immunity to tick-borne encephalitis virus on the characteristics of the epidemic process in Russia

    Muminov, T. K., Gushchin, V. A., Kleymenov, D. A., Tkachuk, A. P., Manuylov, V. A., Siniavin, A. E., Ogarkova, D. A., Kuznetsova, N. A., Zlobin, V. I. & Gintsburg, A. L., 8 Aug 2025, In: Frontiers in Immunology. 16, 12 p.

    Research output: Contribution to journal › Article › peer-review

  13. Towards Verification Reflex Programs in the Rodin Platform

    Shabanova, M. & Garanina, N., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1490-1495 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  14. Using Algorithmic Complexity Metrics for Process-Oriented Specifications

    Abramenko, A. & Zyubin, V., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1430-1434 5 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  15. Using Machine Learning Methods to Search for EEG and Genetic Markers of Depressive Disorder

    Zorina, K., Kriveckiy, A., Klemeshova, D., Bocharov, A. & Karmanov, V., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1790-1793 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  16. Validation of the Russian Version of the Broad Autism Phenotype Questionnaire in a Russian Speaking Sample of Neurotypical Subjects

    Kuleshov, D., Vlasov, M. & Vergunov, E., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1770-1773 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  17. Verification Condition Generator for Revised Reflex Language Using Isabelle/HOL

    Ищенко, А. Д. & Ануреев, И. С., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1440-1445 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  18. EPR spectroscopy in the study of ribosomal complexes

    Krumkacheva, O., Malygin, A., Graifer, D., Kolokolov, M. & Bagryanskaya, E., 6 Aug 2025, In: Biophysical Reviews.

    Research output: Contribution to journal › Review article › peer-review

  19. Mittag-Leffler Restoration Formula for Discrete Analytic Functions

    Danilov, O. A., Lu, X., Liu, L. & Lu, X., 6 Aug 2025, In: Siberian Advances in Mathematics. 35, 2, p. 99-112 14 p.

    Research output: Contribution to journal › Article › peer-review

  20. Ternary Kulakov Algebras With an Elementary Identity

    Neshchadim, M. V. & Simonov, A. A., 6 Aug 2025, In: Siberian Advances in Mathematics. 35, 2, p. 156-166 11 p.

    Research output: Contribution to journal › Article › peer-review

  21. The Structure of the Characteristic Polynomial of the Laplacian Matrix for a Circulant Graph with Non-Fixed Jumps

    Mednykh, A. D., Mednykh, I. A. & Sokolova, G. K., 6 Aug 2025, In: Siberian Advances in Mathematics. 35, 2, p. 146-155 10 p.

    Research output: Contribution to journal › Article › peer-review

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