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  1. 2019

  2. Efficient electromagnetic emission from plasma with continuously injected counterstreaming electron beams

    Volchok, E. P., Annenkov, V. V., Timofeev, I. V. & Berendeev, E. A., 1 Jan 2019.

    Research output: Contribution to conference › Paper › peer-review

  3. Efficient numerics for the analysis of fibre-reinforced composites subjected to large viscoplastic strains

    Shutov, A. V. & Tagiltsev, I. I., 1 Jan 2019, Advanced Structured Materials. Springer, p. 367-380 14 p. (Advanced Structured Materials; vol. 100).

    Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research › peer-review

  4. Effortful control and child well-being

    Slobodskaya, H. R., Kozlova, E. A., Bairova, N. B., Petrenko, E. N. & Leto, I. V., 1 Jan 2019, In: Psikhologicheskii Zhurnal. 40, 5, p. 62-73 12 p.

    Research output: Contribution to journal › Article › peer-review

  5. Electromagnetic drying of wet materials with a small depth of penetration of microwave radiation in the conditions of heat removal by radiation and convection. II. Stage of constant drying speed

    Salomatov, V. V., Karelin, V. A. & Salomatov, V. V., 1 Jan 2019, In: Bulletin of the Tomsk Polytechnic University, Geo Assets Engineering. 330, 12, p. 119-125 7 p.

    Research output: Contribution to journal › Article › peer-review

  6. Electromagnetic drying of wet materials with microwave low penetration depth in conditions of heat removal by radiation and convection. I. Warm up phase

    Salomatov, V. V., Karelin, V. A. & Salomatov, V. V., 1 Jan 2019, In: Известия Томского политехнического университета. Инжиниринг георесурсов. 330, 10, p. 49-60 12 p.

    Research output: Contribution to journal › Article › peer-review

  7. Ellipsometric Method for Measuring the CdTe Buffer-Layer Temperature in the Molecular-Beam Epitaxy of CdHgTe

    Shvets, V. A., Azarov, I. A., Marin, D. V., Yakushev, M. V. & Rykhlitsky, S. V., 1 Jan 2019, In: Semiconductors. 53, 1, p. 132-137 6 p.

    Research output: Contribution to journal › Article › peer-review

  8. Ellipsometric Method of Substrate Temperature Measurement in Low-Temperature Processes of Epitaxy of InSb Layers

    Shvets, V. A., Azarov, I. A., Rykhlitskii, S. V. & Toropov, A. I., 1 Jan 2019, In: Optoelectronics, Instrumentation and Data Processing. 55, 1, p. 8-15 8 p.

    Research output: Contribution to journal › Article › peer-review

  9. Embedding of iron silicide nanocrystals into monocrystalline silicon: Suppression of emersion effect

    Chusovitin, E., Goroshko, D., Dotsenko, S., Shevlyagin, A., Gutakovskii, A. & Galkin, N., 1 Jan 2019, Asia-Pacific Conference on Fundamental Problems of Opto- and Microelectronics 2017. Kulchin, Y. N., Romashko, R. V. & Jiang, J-C. (eds.). The International Society for Optical Engineering, Vol. 11024. p. 3 8 p. 1102402. (Proceedings of SPIE; vol. 11024).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  10. Empedocles' fragment B17 (a translation with commentaries)

    Afonasina, A., 1 Jan 2019, In: Schole. 13, 1, p. 375-381 7 p.

    Research output: Contribution to journal › Article › peer-review

  11. Empedocles' Fragment B17 + ensemble C of the Strasbourg papyrus (= B20) (a translation with commentaries)

    Afonasina, A., 1 Jan 2019, In: Schole. 13, 2, p. 755-763 9 p.

    Research output: Contribution to journal › Article › peer-review

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