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  1. 2025

  2. Application of Numerical Methods Based on Wavelet Transforms for Detection of Homogeneous Areas on Logging Diagrams

    Vlasov, A. & Kraynikovskiy, S., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 2420-2424 5 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  3. A Study of the Method of Passive Remote Multichannel Analysis of Surface Waves as Applied to the Determination of the Velocity Structure of Near-Surface Soils

    Yablokov, A. V., Efremov, R. A. & Dergach, P. A., 8 Aug 2025, In: Seismic instruments. 61, 1, p. 91-104 14 p.

    Research output: Contribution to journal › Article › peer-review

  4. Depression Detection Through EEG Signal Analysis: A Convolutional Autoencoder Deep Learning Model

    Firoz, N., Aksyonov, S. V., Berestneva, O. G. & Savostyanov, A., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1820-1825 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  5. Development of a Comprehensive Methodology for Assessing Executive Control Measures and Its Validation on Groups of Russian and Foreign Students

    Zorina, K. A., Bodur, V. D., Tolstova, M. A. & Vergunov, E. G., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1800-1804 5 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  6. Development of a Microprocessor Quadrotor Control System

    Khodatovich, E. & Kotov, K., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1190-1195 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  7. Development of a Neurolinguistic Testing Technique to Identify Brain Self-Referential Processes

    Zlaia, S., Istomina, N., Stepanova, V., Savostyanov, V. & Tamozhnikov, S., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1840-1843 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  8. Development of a Personalized Recommendation System with High Data Protection

    Palchunova, O., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1830-1833 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  9. First observation of Λc(2595)+ → $$ {\Lambda}_c^{+}{\pi}^0{\pi}^0 $$ and Λc(2625)+ → $$ {\Lambda}_c^{+}{\pi}^0{\pi}^0 $$

    BESIII Collaboration & Мучной, Н. Ю., 8 Aug 2025, In: Journal of High Energy Physics. 2025, 8, 65.

    Research output: Contribution to journal › Article › peer-review

  10. Jet Streams Upon Impact on Joints of Structural Materials

    Khalemenchuk, V., Artur, A., Rubtsov, I., Ten, K., Tumanik, A. & Kashkarov, A., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 630-634 5 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  11. Kinetic Study of Ge Nanocluster Formation in Composite GeOx[SiO2] Films

    Kislukhin, N. A., Astankova, K. N. & Volodin, V. A., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 120-124 5 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  12. Methods of Automatic Selection of Named Entities (NER) in Uzbek Language for Text Tone Analysis

    Saidov, B. R., Barakhnin, V. B., Rixsibayev, U. T., Sobirov, O. O., Bekchanov, K. M. & Sharipov, E. J., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1740-1745 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  13. Prediction of Anxiety Levels Based on Spatial-Frequency Patterns of EEG Activity During Perception of Another Person's Face

    Lozhnikov, V., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1850-1853 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  14. Search for a Neutral Gauge Boson with Nonuniversal Fermion Couplings in Vector Boson Fusion Processes in Proton-Proton Collisions at sqrt[s]=13  TeV

    The CMS collaboration & Сковпень, Ю. И., 8 Aug 2025, In: Physical Review Letters. 135, 6, 22 p., 061803.

    Research output: Contribution to journal › Article › peer-review

  15. Semi-Automated Framework for Feature Engineering in Machine Learning and Data Analysis

    Radeev, N. & Vinogradova, K., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1520-1525 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  16. Structural Transformation of Bi2Se3(001) Surface during Sn Monolayer Annealing

    Zakhozhev, K., Ponomarev, S., Golyashov, V., Nasimov, D., Kokh, K. & Rogilo, D., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 80-83 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  17. Study of the influence of population immunity to tick-borne encephalitis virus on the characteristics of the epidemic process in Russia

    Muminov, T. K., Gushchin, V. A., Kleymenov, D. A., Tkachuk, A. P., Manuylov, V. A., Siniavin, A. E., Ogarkova, D. A., Kuznetsova, N. A., Zlobin, V. I. & Gintsburg, A. L., 8 Aug 2025, In: Frontiers in Immunology. 16, p. 1525388 12 p.

    Research output: Contribution to journal › Article › peer-review

  18. Towards Verification Reflex Programs in the Rodin Platform

    Shabanova, M. & Garanina, N., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1490-1495 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  19. Using Algorithmic Complexity Metrics for Process-Oriented Specifications

    Abramenko, A. & Zyubin, V., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1430-1434 5 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  20. Using Machine Learning Methods to Search for EEG and Genetic Markers of Depressive Disorder

    Zorina, K., Kriveckiy, A., Klemeshova, D., Bocharov, A. & Karmanov, V., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1790-1793 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  21. Validation of the Russian Version of the Broad Autism Phenotype Questionnaire in a Russian Speaking Sample of Neurotypical Subjects

    Kuleshov, D., Vlasov, M. & Vergunov, E., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1770-1773 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

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