Jet Streams Upon Impact on Joints of Structural Materials

Khalemenchuk, V., Artur, A., Rubtsov, I., Ten, K., Tumanik, A. & Kashkarov, A., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 630-634 5 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Kinetic Study of Ge Nanocluster Formation in Composite GeOx[SiO2] Films

Kislukhin, N. A., Astankova, K. N. & Volodin, V. A., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 120-124 5 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Methods of Automatic Selection of Named Entities (NER) in Uzbek Language for Text Tone Analysis

Saidov, B. R., Barakhnin, V. B., Rixsibayev, U. T., Sobirov, O. O., Bekchanov, K. M. & Sharipov, E. J., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1740-1745 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Prediction of Anxiety Levels Based on Spatial-Frequency Patterns of EEG Activity During Perception of Another Person's Face

Lozhnikov, V., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1850-1853 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Semi-Automated Framework for Feature Engineering in Machine Learning and Data Analysis

Radeev, N. & Vinogradova, K., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1520-1525 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Structural Transformation of Bi2Se3(001) Surface during Sn Monolayer Annealing

Zakhozhev, K., Ponomarev, S., Golyashov, V., Nasimov, D., Kokh, K. & Rogilo, D., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 80-83 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Towards Verification Reflex Programs in the Rodin Platform

Shabanova, M. & Garanina, N., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1490-1495 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Using Algorithmic Complexity Metrics for Process-Oriented Specifications

Abramenko, A. & Zyubin, V., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1430-1434 5 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review