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  1. Elements of the Terahertz Power Reflective Optics with Free-Form Surfaces

    Agafonov, A. N., Knyazev, B. A., Pavel’ev, V. S., Akhmetova, E. I. & Platonov, V. I., 1 Mar 2019, In: Optoelectronics, Instrumentation and Data Processing. 55, 2, p. 148-153 6 p.

    Research output: Contribution to journalArticlepeer-review

  2. Elevated reaction order of 1,3,5-tri-tert-butylbenzene bromination as evidence of a clustered polybromide transition state: a combined kinetic and computational study

    Shernyukov, A. V., Genaev, A. M., Salnikov, G. E., Shubin, V. G. & Rzepa, H. S., 21 Apr 2019, In: Organic and Biomolecular Chemistry. 17, 15, p. 3781-3789 9 p.

    Research output: Contribution to journalArticlepeer-review

  3. Eleventh Dynasty Written Evidence on the Relationship between the κ and the Cult Image

    Demidchik, A. E., 1 Jun 2015, In: Zeitschrift fur Agyptische Sprache und Altertumskunde. 142, 1, p. 25-32 8 p.

    Research output: Contribution to journalArticlepeer-review

  4. Elimination of oxide films during Spark Plasma Sintering of metallic powders: A case study using partially oxidized nickel

    Dudina, D. V. & Bokhonov, B. B., 1 Feb 2017, In: Advanced Powder Technology. 28, 2, p. 641-647 7 p.

    Research output: Contribution to journalArticlepeer-review

  5. Ellipsometric In Situ Methods of Temperature Control in the Technology of Growing MBE MCT Layers

    Shvets, V. A., Marin, D. V., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., Sept 2021, In: Optoelectronics, Instrumentation and Data Processing. 57, 5, p. 476-484 9 p., 5.

    Research output: Contribution to journalArticlepeer-review

  6. Ellipsometric Method for Measuring the CdTe Buffer-Layer Temperature in the Molecular-Beam Epitaxy of CdHgTe

    Shvets, V. A., Azarov, I. A., Marin, D. V., Yakushev, M. V. & Rykhlitsky, S. V., 1 Jan 2019, In: Semiconductors. 53, 1, p. 132-137 6 p.

    Research output: Contribution to journalArticlepeer-review

  7. Ellipsometric Method of Substrate Temperature Measurement in Low-Temperature Processes of Epitaxy of InSb Layers

    Shvets, V. A., Azarov, I. A., Rykhlitskii, S. V. & Toropov, A. I., 1 Jan 2019, In: Optoelectronics, Instrumentation and Data Processing. 55, 1, p. 8-15 8 p.

    Research output: Contribution to journalArticlepeer-review

  8. Ellipsometric thermometry in molecular beam epitaxy of mercury cadmium telluride

    Marin, D. V., Shvets, V. A., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., Aug 2021, In: Infrared Physics and Technology. 116, 103793.

    Research output: Contribution to journalArticlepeer-review

  9. Ellipsometry, Raman spectroscopy and SOI- nanowire biosensor in diagnosis of colorectalcancer

    Kruchinina, M. V., Prudnikova, Y. I., Kurilovich, S. A., Gromov, A. A., Kruchinin, V. N., Atuchin, V. V., Naumova, O. V., Spesivtsev, E. V., Volodin, V. A., Peltek, S. E., Shuvalov, G. V. & Generalov, V. M., 2017, In: Siberian Journal of Oncology. 16, 4, p. 32-41 10 p.

    Research output: Contribution to journalArticlepeer-review

  10. Elliptic Flow of Charm and Strange Hadrons in High-Multiplicity p+Pb Collisions at sNN =8.16 TeV

    The CMS collaboration, 21 Aug 2018, In: Physical Review Letters. 121, 8, 18 p., 082301.

    Research output: Contribution to journalArticlepeer-review