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  1. 2021

  2. Synthesis, Characterization and Photovoltaic Properties of Electron-Accepting (11-Oxoanthra[2,1-b]thiophen-6-ylidene)dipropanedinitrile-Based Molecules

    Baranov, D. S., Nevostruev, D. A., Kazantsev, M. S., Zinoviev, V. A., Zelentsova, E. A., Dmitriev, A. A., Gritsan, N. P., Tsentalovich, Y. P., Kotova, M., Düreth, J., Sperlich, A., Dyakonov, V. & Kulik, L. V., 28 Jun 2021, In: ChemistrySelect. 6, 24, p. 6043-6049 7 p.

    Research output: Contribution to journal › Article › peer-review

  3. Истечение микроструи этанола из отверстия в вакуум

    Яскин, А. С., Зарвин, А. Е., Каляда, В. В., Дубровин, К. А. & Художитков, В. Э., 28 Jun 2021, Оптические методы исследования потоков: Труды XVI Международной научно-технической конференции. Дубнищев, Ю. Н. & Скорнякова, Н. М. (eds.). Москва: Издательство "Перо", p. 252-258 7 p.

    Research output: Chapter in Book/Report/Conference proceeding › Article in an anthology › peer-review

  4. Assessment of Residual Stresses in a T-joint Weld by Combined Experimental/Theoretical Approach

    Tagiltsev, I. I. & Shutov, A. V., 29 Jun 2021, In: Journal of Physics: Conference Series. 1945, 1, 012059.

    Research output: Contribution to journal › Conference article › peer-review

  5. How Self-Appraisal Is Mediated by the Brain

    Knyazev, G. G., Savostyanov, A. N., Bocharov, A. V. & Rudych, P. D., 29 Jun 2021, In: Frontiers in Human Neuroscience. 15, 700046.

    Research output: Contribution to journal › Article › peer-review

  6. Invariant Procedure for Error Sensitivity Analysis Applied to Cyclic Creep Modelling

    Kaygorodtseva, A. A., Zakharchenko, K. V., Kapustin, V. I. & Shutov, A. V., 29 Jun 2021, In: Journal of Physics: Conference Series. 1945, 1, 012015.

    Research output: Contribution to journal › Conference article › peer-review

  7. Nonlocal FEM Simulations of Ductile Damage with Regularized Crack Path Predictions

    Klyuchancev, V. S. & Shutov, A. V., 29 Jun 2021, In: Journal of Physics: Conference Series. 1945, 1, 012018.

    Research output: Contribution to journal › Conference article › peer-review

  8. Application of the Metric Learning for Security Incident Playbook Recommendation

    Kraeva, I. & Yakhyaeva, G., 30 Jun 2021, 2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials, EDM 2021 - Proceedings. IEEE Computer Society, p. 475-479 5 p. 9507632. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM; vol. 2021-June).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  9. A System for Visualizing the Three-Dimensional Spherical and Elliptic Spaces

    Migranov, D., 30 Jun 2021, 2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials, EDM 2021 - Proceedings. IEEE Computer Society, p. 507-510 4 p. 9507602. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM; vol. 2021-June).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  10. Development of an Application for Audio-Visual-Tactile Brainwave Entrainment in Patients with Affective and Psychosomatic Disorders

    Korshunov, V. A., Khazankin, G. R. & Ivanishkin, D. S., 30 Jun 2021, 2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials, EDM 2021 - Proceedings. IEEE Computer Society, p. 551-554 4 p. 9507617. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM; vol. 2021-June).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  11. Development of Automated Methods for the Domain Ontology Population with the Help of a Virtual Assistant

    Orlovsky, A. & Palchunov, D., 30 Jun 2021, 2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials, EDM 2021 - Proceedings. IEEE Computer Society, p. 537-541 5 p. 9507641. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM; vol. 2021-June).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

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