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  1. Development of μ-RWELL detectors for the upgrade of the tracking system of CMD-3 detector

    Shekhtman, L., Fedotovich, G., Kozyrev, A., Kudryavtsev, V., Maltsev, T. & Ruban, A., 21 Aug 2019, In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 936, p. 401-404 4 p.

    Research output: Contribution to journal › Review article › peer-review

  2. Development of the microstrip silicon detector for imaging of fast processes at a synchrotron radiation beam

    Aulchenko, V., Pruuel, E., Shekhtman, L., Ten, K., Tolochko, B. & Zhulanov, V., 11 Feb 2017, In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 845, p. 169-172 4 p.

    Research output: Contribution to journal › Article › peer-review

  3. Development of the micro-RWELL discs for the CMD-3 detector

    Fedotovich, G., Kudryavtsev, V. & Shekhtman, L., 11 Oct 2022, In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 1041, 167316.

    Research output: Contribution to journal › Article › peer-review

  4. Development of the micro-resistive WELL discs for the CMD-3 tracking system

    Batalov, E., Fedotovich, G., Kozyrev, A., Kudryavtsev, V., Ruban, A. & Shekhtman, L., 5 Jun 2020, In: Journal of Instrumentation. 15, 6, 7 p., C06012.

    Research output: Contribution to journal › Article › peer-review

  5. Development of Specialized Integrated Circuits for Coordinate X-Ray Detectors

    Glushak, A. A., Aulchenko, V. M., Shekhtman, L. I. & Zhulanov, V. V., 2023, Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023. Institute of Electrical and Electronics Engineers Inc., p. 50-53 4 p.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  6. Development of One-Coordinate Detector for Diffraction Experiments at a SynchrotronRadiation Beam

    Aulchenko, V. M., Glushak, A. A., Zhulanov, V. V., Shekhtman, L. I. & Titov, V. M., 2023, 24th IEEE International Conference of Young Professionals in Electron Devices and Materials, EDM 2023; Novosibirsk; Russian Federation; 29 June 2023 до 3 July 2023. IEEE Computer Society, 4 p.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  7. Development of high-resolution GEM-based detector for the extracted electron beam facility at the VEPP-4M collider

    Bobrovnikov, V. S., Kudryavtsev, V. N., Maltsev, T. V. & Shekhtman, L. I., 25 Jul 2017, In: Journal of Instrumentation. 12, 7, 8 p., 07036.

    Research output: Contribution to journal › Article › peer-review

  8. Development of Detectors for Station 1–3 “Fast Processes” of the SKIF Center for Collective Use

    Shekhtman, L. I., Aulchenko, V. M., Burdin, V. E., Glushak, A. A., Kornievsky, M. A., Kudryavtsev, V. N., Titov, V. M., Tolbanov, O. P., Tyazhev, A. V., Zarubin, A. N. & Zhulanov, V. V., 17 Jan 2025, In: Bulletin of the Russian Academy of Sciences: Physics. 88, Suppl 1, p. S105-S115 11 p.

    Research output: Contribution to journal › Article › peer-review

  9. Development of detectors for 1–3 fast processes station of SKIF center for collective use

    Шехтман, Л. И., Аульченко, В. М., Бурдин, В. Е., Глушак, А. А., Kornievsky, M. A., Кудрявцев, В. Н., Титов, В. М., Tolbanov, O. P., Tyazhev, A. V., Zarubin, A. N. & Zhulanov, V. V., 19 Mar 2025, In: Russian Physics Journal.

    Research output: Contribution to journal › Article › peer-review

  10. Development of compact TPC for future Super Charm-Tau Factory detector

    Sokolov, A., Maltsev, T., Shekhtman, L. & Vadakeppattu, V. K., 1 Oct 2022, In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 1040, 167225.

    Research output: Contribution to journal › Article › peer-review

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