Олег Эдуардович Камешков - Research output › Research Explorer

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Олег Эдуардович Камешков

Олег Эдуардович Камешков

Kameshkov, Oleg Eduardovich

(Former)

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2024
Principles of Measuring Thickness and Refractive Index of Thin Dielectric Film by Using Multiresonance Archimedean Spiral Metasurfaces with C Resonator in the Terahertz Frequency Range
Kameshkov, O. & Gerasimov, V., Jun 2024, In: Photonics. 11, 6, 529.
Research output: Contribution to journal › Article › peer-review

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ID: 3549611