1. 2023
  2. iOk Platform for Automated Object Detection and Analysis in Microscopy Images

    Kudinov, V. Y., Matveev, A. V., Nartova, A. V., Sankova, N. N., Belotserkovskii, V. A. & Okunev, A. G., 2023, Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023. Institute of Electrical and Electronics Engineers (IEEE), p. 1420-1423 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

  3. Using PCA Machine Learning Approach Based on Psychological Questionnaires and Spectral Characteristics of the EEG to Separate the Healthy Participants and Participants with Major Depressive Disorder

    Merkulova, E. A., Kozulin, I. A., Savostyanov, A. N., Bocharov, A. V. & Privodnova, E. Y., 2023, 24th IEEE International Conference of Young Professionals in Electron Devices and Materials, EDM 2023; Novosibirsk; Russian Federation; 29 June 2023 до 3 July 2023. Institute of Electrical and Electronics Engineers (IEEE), p. 1740-1745 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

  4. 2022
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